Hostname: page-component-cd9895bd7-gvvz8 Total loading time: 0 Render date: 2024-12-25T03:18:21.850Z Has data issue: false hasContentIssue false
  • English
  • Français

Microstructure, Mass and Chemical Analysis with 8 to 44 Angstrom X-Radiation

Published online by Cambridge University Press:  06 March 2019

Burton L. Henke
Burton L. Henke*
Affiliation:
Pomona College Department of Physics, Claremont, California
Get access

Abstract

The requirement of ultrasoft x-radiation (10 to 100A) for high resolution microradiographic analysis is established. Optimum methods are described for obtaining structure, mass distribution and mass-chemical information for microscopic sample regions as small as a few square microns and for total mass as small as a few micro-micrograms. The details of the techniques and of the instrumentation which are used in high resolution microradiographic analysis are presented.

There has been a considerable amount of work reported on low magnification microradiography (up to 100 diameters) using conventional x-ray wavelengths.

Relatively little work has been done in high resolution microradiography and with ultra soft x-radiation. Nearly all which has been reported has been in application to biological research where the need for such an analysis method seems to be greatest at this time. Outstanding among this work has been that of Engstrom and his co-workers.

Much of the material which is presented in the present paper is intended as a supplement to that presented in the works of Engstrom and Lindstrom and with an emphasis upon the quantitative aspects of microradiographic analysis, using ultrasoft x-radiation.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 2: Seventh Annual Conference on Industrial Applications of X-ray Analysis, August 13-15, 1958 , 1958 , pp. 117 - 155
Copyright
Copyright © International Centre for Diffraction Data 1958

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1Principles of Microradiography and Bibliography, prepared by the Eastman Kodak Research Laboratory and published by the Philips Electronics Corporation, Mt. Vernon, N. Y.Google Scholar
2 Clark, George L., Applied X-Rays, McGraw-Hill, N. Y., Chapter 10, 1955.Google Scholar
3X-Ray Microscopy and Microradiography, Academic Press, N. Y., 1957.Google Scholar
4 Engstrom, A. “Histioradiography,” Physical Techniques in Biological Research, Academic Press, N. Y., Vol. II, 1956.Google Scholar
5 lindstrom, B., (Thesis), Acta Radiol., Supp. 125, 1955.Google Scholar
6 Henke, Burton L., White, Richard and Lundberg, Bruno. “Seraiempirical Determination of Mass Absorption Coefficients for the 5 to 50 Angstrom X-Ray Region,” J. Appl. Pirn. Vol. 28, p. 98, 1957.Google Scholar
7 Henke, Burton L. and Jesse DuMond, W. M., “Submicroscopic Structure Determination by Long Wavelength X-Ray Diffraction,” J. Appl. Phys. Vol, 26, p. 903, 1955.Google Scholar
8 Henke, Burton L. and Miller, Jack C., “Dispersion of Ultrasoft X-Rays,” (in preparation).Google Scholar
9 Crawford, B. H., “The Preparation of Ultra-fine Grain Photographic Emulsions, J. Sri. Instr, Vol. 31, p. 333, 1954.Google Scholar