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Micro-Analysis by X-Ray Absorption, Fluorescence, Emission and Diffraction Using Ultra-Fine X-Ray Sources

Published online by Cambridge University Press:  06 March 2019

V. E. Cosslett ,
P. Duncumb ,
J. V. P. Long  and
W. G. Nixon
V. E. Cosslett
Affiliation:
Cambridge University, Cambridge, England
P. Duncumb
Affiliation:
Cambridge University, Cambridge, England
J. V. P. Long
Affiliation:
Cambridge University, Cambridge, England
W. G. Nixon
Affiliation:
Cambridge University, Cambridge, England
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Abstract

Fine focus X-ray tubes developed for projection X-ray microscopy can also be used for X-ray micro-analysis. Areas about 10 microns in diameter of thin sections have been analyzed by measuring differences in X-ray transmission, with particular reference to the determination of calcium in biological materials and in minerals. The high intensity of this X-ray point source has permitted micro-fluorescence analysis of similar small areas with high sensitivity and reasonable time. The same electron optical system has been used for micro-emission analysis of rock slices and mineral grains. By scanning the electron beam over the specimen surface and recording either the scattered electrons or the emitted X-rays, a two-dimensional picture can be displayed of the physical features or of the distribution of a particular element respectively. The analysis of a selected, volume of 1 cubic micron in the surface has been obtained by plotting the characteristic line emission spectrum with a crystal spectrometer and proportional counter. The sensitivity is 0. 1% or 10−1 gram. Micro-beam X-ray diffraction has also been used with a stationary X-ray source both for transmission and back reflection with a 10 minute exposure from a 10 micron diameter area.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 1: Sixth Annual Conference on Industrial Applications of X-ray Analysis, August 7-9, 1957 , 1957 , pp. 329 - 337
Copyright
Copyright © International Centre for Diffraction Data 1957

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References

1. Engström, A. Acta Radiol. (Stockholm), Suppl. 63Google Scholar
2. Engström, A. Progress in Biophysics and Biophysical Chemistry, Vol. 1, p. 164, Pergamon Press: London, (1950).Google Scholar
3. Engström, A. Physiol. Rev. 35, 190 (1953).Google Scholar
4. Castaing, R. Thesis, Paris, (1951).Google Scholar
5. Cosslett, V. E. and Nixon, W. C., J. Appl, Phya, 24, 616 (1953).Google Scholar
6. Cosslett, V. E. and Duncumb, P., Nature, 177, 1172 (1956).Google Scholar
7.Full results of all X-ray methods are given in the Proceedings of the Cambridge Symposium on X-Ray Microscopy and Microradiography, Cavendish Laboratory, Ga-mbridge, England, August 1956, published by the Academic Press, New York, 1957.Google Scholar