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Method of Measurement of Mean Concentration for an Element Segregated in Layers by X-Ray Analysis

Published online by Cambridge University Press:  06 March 2019

I. Vander
I. Vander*
Affiliation:
Department of Physics, Queens College of the City University of New York, Flushing, New York 11367
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Extract

Traditionally, in X-ray fluorescence analysis for the determination of elemental compositions, the fluorescence is measured from the irradiated side of the sample. The composition measurements obtained by this method are sensitive to a gradient in composition as a function of depth of the element being measured. This report presents a simple method for measuring a mean composition for an element segregated in layers applicable to thin samples so that the fluorescence can be measured on the side opposite to that being irradiated. It is shown that for a particular relation between the angle of incidence of the primary radiation and of the detection angle on the opposite side of the sample that a mean concentration can be measured for an element which is independent of the composition in the separate layers.

Type
Note
Information
Advances in X-Ray Analysis , Volume 21: Twenty-Sixth Annual Conference on Applications of X-ray Analysis, August 3-5, 1977 , 1977 , pp. 143 - 147
Copyright
Copyright © International Centre for Diffraction Data 1977

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References

1. Pivovarov, A.V., Rubanov, I.A., Apparatus and Methods of X-Ray Analysis 11, 115 (1972) (USSR).Google Scholar
2. Bertin, E., Principles and Practice of X-Ray Spectrometric Analysis (1975), Plenum Press, New York.Google Scholar