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The Measurement of Thermally Induced Structural Changes by High Temperature (900°C) Guinier X-Ray Powder Diffraction Techniques

Published online by Cambridge University Press:  06 March 2019

T. G. Fawcett ,
P. Moore Kirchhoff  and
R. A. Newman
T. G. Fawcett
Affiliation:
The Dow Chemical Company, Midland, Michigan 48640
P. Moore Kirchhoff
Affiliation:
The Dow Chemical Company, Midland, Michigan 48640
R. A. Newman
Affiliation:
The Dow Chemical Company, Midland, Michigan 48640
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Abstract

A new method for the collection and analysis of high temperature Guinier x-ray data has been devised at The Dow Chemical Co. This technique can be used to monitor various types of structural transformation and thermal expansions up to 900°C. The thermal expansions of α-Al2O3 and two TiO2 structures, anatase and rutile, have been characterized for their use as high temperature internal standards.

Type
IV. XRD Applications and Automation
Information
Advances in X-Ray Analysis , Volume 26: Thirty-First Annual Conference on Applications of X-ray Analysis, August 1-6, 1982 , 1982 , pp. 171 - 180
Copyright
Copyright © International Centre for Diffraction Data 1982

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References

1. Brown, A. and Edmonds, J. W., The Fitting of Powder Diffraction Profiles to an Analytical Expression and the Influence of Line Broadening Factors, Adv. in X-Ray Analysis, 23:361 (1980).Google Scholar
2. Edmonds, J. W. and Henslee, W. W., Application of Guinier Camera, Microcomputer Controlled Film Densitometry, and Pattern Search-Match Procedures to Rapid Routine X-Ray Powder Diffraction Analysis, Adv. in X-Ray Analysis, 22:143 C1979).Google Scholar
3. Snyder, R. L. and Edmonds, J. W., Symposium on Powder Data Collection and Analysis, XII IUCr Congress, Ottawa, Canada (1981).Google Scholar
4. Brown, A., Edmonds, J. W. and Foris, C. M., Reproducibility and Precision of Measurements of Guinier Powder Patterns Using Powdered Silicon Calibrant, Adv. in X-Ray Analysis. 24:111 (1981).Google Scholar
5. Brown, A., Symposium on Powder Data Collection and Analysis, XII lUCr Congress, Ottawa, Canada (1981), also see articles by Brown, A. in Adv. in X-Ray Analysis, 26 (1983).Google Scholar
6. Klug, H. P. and Alexander, L. E. Diffractometric Powder Technique Profiles and Positions of Diffraction Maxima ‘-in:“X-Ray Diffraction Procedures”, John Wiley and Sons, N.Y., N.Y. (1974)… ¦.Google Scholar
7. Rao, K. V. K., Maidu, S. V. N. and Iyengar, L., Thermal Expansion of. Rutile and Anatase, J.Arn. Ceramic.Soc., 53:124 (1970).Google Scholar
8. Pearson, W. B., “A Handbook of Lattice Spacings and Structures of Metals and Alloys”, Pergamon Press, N.Y.,:N.Y. (1958),Google Scholar
9. Wells, A. F., Metals and Alloys in:Structural Inorganic Chemistry”, Clarendon Press, Oxford University, London, England (1962).Google Scholar
10. Frevel, L. K., Automated Measurement of Powder Diffraction. Patterns, Anal. Chem., 38:1914 (1966).Google Scholar
11. Frevel, L. K., Adams, C. E. and Ruhberg, L. R., A Fast Search-Match Program for Powder Diffraction Analysis, J. Appl. Cryst, 9:199 (1976).Google Scholar
12. Edmonds, J. W., Generalization of the Frevel ZRD-Search-Match Program for Powder Diffraction Analysis, Norelco Reporter, 27:22 (1980).Google Scholar