Hostname: page-component-cd9895bd7-gbm5v Total loading time: 0 Render date: 2024-12-25T02:08:02.863Z Has data issue: false hasContentIssue false
  • English
  • Français

Mathematical Correction Procedures in XRF - The Long and the Short

Published online by Cambridge University Press:  06 March 2019

Gerald R. Lachance
Gerald R. Lachance*
Affiliation:
Nepean, Ontario, Canada
Get access

Extract

The processes of absorption and enhancement in x-ray fluorescence spectrometry preclude the direct conversion of measured intensities to concentrations unless the specimens being analyzed are practically identical to the reference materials that were used as standards for calibration. While well known techniques of spectrometry such as the use of internal standards or techniques specific to x-ray fluorescence such as Compton scatter may be used in some instances, the analysis of alloys for example is not amenable to these techniques. The goal of mathematical correction procedures is to compensate adequately for matrix effects and therefore to extend the concentration range within which analysis may be accomplished. The evolution of the concepts and expressions that have been proposed for this purpose spans some 50 years, is somewhat fascinating and examined in outline after a brief nostalgic look at where it all began.

Type
X. Mathematical Methods in X-Ray Spectrometry (XRS)
Information
Advances in X-Ray Analysis , Volume 35 , Issue B: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 693 - 701
Copyright
Copyright © International Centre for Diffraction Data 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Moseley, H. G. J., Philos Mag. 26, 1024 (1913).Google Scholar
2. Moseley, H. G. J., Philos Mag. 27, 703 (1914).Google Scholar
3. von Hevesy, G., Chemical Analysis by X-Rays and its Applications, McGraw-Hill Book Co., New York (1932).Google Scholar
4. von Hamos, L., Arkiv. Math. Astron. Fys. 31a, 25 (1945).Google Scholar
5. Sherman, J., ASTM Special Tech. Publ. No. 157 (1954).Google Scholar
6. Sherman, J., Spectrochirn. Acta, 7, 283 (1955).Google Scholar
7. Shiraiwa, T., and Fujino, N., Japan J. of Appl. Phys. 5, 886 (1966).Google Scholar
8. Gillarn, E., and Heal, H. T., Brit. Jour. Appl. Physics 3, 353 (1952).Google Scholar
9. Beattie, H. J., and Brissey, R. M., Anal. Chem. 26, 981 (1954).Google Scholar
10. Campbell, W. J., and Carl, H. P., Norelco Reporter, v.III (1956).Google Scholar
11. Mitchell, B.J., Anal. Chem. 33, 917 (1961).Google Scholar
12. Lucas-Tooth, H. J., and Price, B. J., Metallurgia 64, 149 (1961).Google Scholar
13. Lucas-Tooth, H. J., and Pyne, C., Adv. in X-Ray Anal., v.7, 523 Plenum Press, New York (1964).Google Scholar
14. Lachance, G. R., and Traill, R. J., Can. Spectrosc. 11, 43 (1966).Google Scholar
15. Criss, J. W., and Birks, L. S., Anal. Chem, 40, 1080 (1968).Google Scholar
16. Lachance, G. R., Adv. in X-Ray Anal. v.31, 471, Plenum Press, New York (1988).Google Scholar
17. de Jongh, W. K., X-Ray Spectrom, 2, 151 (1973).Google Scholar
18. de Jongh, W. K., X-Ray Spectrom. 8, 52 (1979).Google Scholar
19. Broil, N., and Tertian, R., X-Ray Spectrom, 12, 1 (1983).Google Scholar
20. Rousseau, R. M., X-Ray Spectrom. 13, 115 (1984).Google Scholar
21. Lachance, G. R., paper presented at the Intern'l Conf. on Industrial Inorganic Elemental Analysis, Metz, France, June 1981.Google Scholar
22. Tertian, R., X-Ray Spectrom. 17, 89 (1988).Google Scholar
23. Rasberry, S. D., and Heinrich, K. F. G., Anal. Chem. 46, 81 (1974).Google Scholar
24. Ito, M., et al., X-Ray Spectrom. 10, 3 (1981).Google Scholar