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Lattice Parameter Determination Using Synchrotron Powder Data

Published online by Cambridge University Press:  06 March 2019

W. Parrish ,
M. Hart ,
T. C Huang  and
M. Bellotto
W. Parrish
Affiliation:
IBM Almaden Research Center, San Jose, California 95120-6099
M. Hart
Affiliation:
IBM Almaden Research Center, San Jose, California 95120-6099
T. C Huang
Affiliation:
IBM Almaden Research Center, San Jose, California 95120-6099
M. Bellotto
Affiliation:
IBM Almaden Research Center, San Jose, California 95120-6099
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Abstract

A method for using synchrotron-radiation parallel-beam X-ray diffractometry for precision measurement of scattering angles and lattice parameters is described. The important advantages of the method are the high P/B made possible by wavelength selection and high source intensity, the symmetrical profiles and the absence of most systematic errors making it unnecessary to use standards. Profile fitting with a pseudo-Voigt function is used to determine 2θ to 0.0001º. The zero-angle correction and lattice parameter were determined from least-squares refinement and the average accuracy of observed-calculated 2θs was 0.0020°. Average values of ∆d/d = ∆a/a directly calculated from the individual hkl measurements ranged from 2x 10-5 to 5.7 x 10-5. The precision estimated from the standard deviation of the mean is in the 10-6 range and 1 ppm precision was obtained for Si. The determination of the exact wavelength selected remains to be solved, but ratios of lattice spacings to standards such as NBS SRM 640a can be determined.

Type
VII. Synchrotron and Neutron Diffraction
Information
Advances in X-Ray Analysis , Volume 30: Thirty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-8, 1986 , 1986 , pp. 373 - 382
Copyright
Copyright © International Centre for Diffraction Data 1986

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References

1. Klug, H.P. and Alexander, L.E., X-Ray Diffraction Procedures for Polvcrvstalline and Amorphous Materials. John Wiley, New York (1974).Google Scholar
2. Wilson, A.J.C., “Accuracy in Methods of Lattice-Parameter Measurement” in: Nat. Bur. Stand. Spec. Pub. 567: 325 (1980).Google Scholar
3. Parrish, W., Acta Cryst. 13:838 (1960).Google Scholar
4. Wilson, A.J.C., Mathematical Theory of X-Ray Powder Diffrac tome try, Philips Techn. Lib., Eindhoven (1963),Google Scholar
5. Wilson, A.J.C., X-Ray Diffraction, ed. by L. V. Azaroff et al., Chap, 6. McGraw-Hill, New York (1974).Google Scholar
6. Parrish, W. and Wilson, A.J.C., Int. Tables for X-Ray Cryst. 11:216, Kynoch Press, Birmingham, England (1959).Google Scholar
7. Ladell, J., Parrish, W. and Taylor, J., Acta Cryst. 12: 561 (1959).Google Scholar
8. Taylor, J.M., Mack, M. and Parrish, W., Acta Cryst. 17: 1229 (1964).Google Scholar
9. Parrish, W., Taylor, J.M. and Mack, M., Adv. X-Ray Anal. 7: 66 (1964).Google Scholar
10. Parrish, W. and Hart, M., Trans. Am. Cryst. Assoc. 21: 51 (1985).Google Scholar
11. Parrish, W., Hart, M., Erickson, C.G., Masciocchi, N. and Huang, T.C., Adv. X-Ray Anal. 29: 243 (1986).Google Scholar
12. Popovic, S., J. Appl. Cryst. 6: 112 (1973).Google Scholar
13. Will, G., Masciocchi, N., Parrish, W. and Hart, M., J. A. pI. Cryst. (submitted for publication).Google Scholar
14. Will, G., Belloto, M., Parrish, W. and Hart, M. (in preparation).Google Scholar
15. Hubbard, C.R., Adv. X-Ray Anal. 26: 45 (1983).Google Scholar
16. Frondel, C., The System of Mineralogy. 7th ed., Vol. III, John Wiley, New York (1962).Google Scholar
17. Bearden, J.A., X-Ray Wavelengths. NYO-10586 (1964).Google Scholar
18. Hart, M., J. Crystal Growth 55: 409 (1981).Google Scholar