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Intensities of the K, L, and M Spectral Lines for the Elements with Atomic Numbers 16 TO 92*

Published online by Cambridge University Press:  06 March 2019

William J. Campbell*
Affiliation:
Bureau of Mines, U.S. Department of the Interior College Park, Maryland
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Abstract

Line intensity and background measurements were made on the K lines for the elements with atomic numbers 16 to 60, L lines for the elements above atomic number 42, and M lines for elements above atomic number 80. Three general classes of samples were investigated: (1) infinitely thick, (2) microgram deposits, and (3) thin layers.

These studies show that longer-wavelength L radiation may be preferable to the K series lines from the same element in the range of elements with atomic numbers 42 to 60, In particular the Lα lines are more intense than the K series lines from Class 2 and 3 samples. With Class 1 samples the Lα lines are weaker than the K series but their line-to-background ratio is superior to the K series.

M series lines show little promise for spectrochemical analysis except for elements with atomic numbers 90 to 92; for example, with uranium samples in Class 2 and 3, the very high line-to-background ratio of the UMβ1 line may have limited application.

Elements with atomic numbers from 16 to 22 are more sensitive than expected due to the very high line-to-background ratios and the reduced collimation requirements in this longwavelength region.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1959

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Footnotes

*

This paper was presented at the Seventh Annual Conference. Approval for publication was received too late for Inclusion in the Proceedings of that conference.

References

1 Richtmyer, F. K. and Kennard, E. H., “Introduction to Modern Physics,” McGraw-Hill Book Company, 4th Edition, 1947, p. 451.Google Scholar
2 Jennings, W. A., “A Theoretical Study of Radiation Outputs and Qualities from a Beryllium Window Tube Operated at Low Kilovoltages (10-50 kvp),” Brit. J. Radiology, Vol. 26, 1953, p. 193.Google Scholar
3 Campbell, W. J., Leon, M., and Thatcher, J. W., “Flat Crystal Xray Optics,” Proceedings 6th Annual X-ray Conference, Denver Research Institute, 1957, p. 193.Google Scholar
4 Compton, A. H. and Allison, S. K., “X-Rays in Theory and Experiment,” D. Van Nostrand Company, 2nd Edition, 1935, pp. 394425, 511-540.Google Scholar
5 Stephenson, R. J., “X-Ray Fluorescence Yields,” Phys, Rev. Vol. 51, 1937, p. 637.Google Scholar
6 Campbell, W. J. and Leon, M., “Preliminary Studies of Selective Oxidation in Molten Metals by Fluorescent X-Ray Spectrography,” Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy, Paper 70, March 1958.Google Scholar