Hostname: page-component-cd9895bd7-dk4vv Total loading time: 0 Render date: 2024-12-25T03:03:56.722Z Has data issue: false hasContentIssue false
  • English
  • Français

Instrumentation for X-Ray Diffraction Studies of Highly Radioactive Samples

Published online by Cambridge University Press:  06 March 2019

Vincent G. Scotti ,
James I. Mueller  and
John J. Little
Vincent G. Scotti
Affiliation:
Pratt & Whitney Aircraft Hot Cell Facility, Livermore, California
James I. Mueller
Affiliation:
Pratt & Whitney Aircraft Hot Cell Facility, Livermore, California
John J. Little
Affiliation:
Pratt & Whitney Aircraft Hot Cell Facility, Livermore, California
Get access

Abstract

With the advent of nuclear engineering, x-ray diffraction has become an important analytical tool in the study of radiation damage due to neutron and gamma-ray irradiation. The materials under study in this work have rdioactive levels up to 40 R/hr. at 17 centimeters combined β and γ. The activity of the various samples under study may be due to (n, γ) reactions or fission products or both.

Data are presented to illustrate the use of sample shielding, detector shielding pulse height discrimination and the combination of all three aids in an effort to attain the most favorable peak to background ratio.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 2: Seventh Annual Conference on Industrial Applications of X-ray Analysis, August 13-15, 1958 , 1958 , pp. 107 - 115
Copyright
Copyright © International Centre for Diffraction Data 1958

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Knowles, D. J., 10th Pittsburgh X-Ray and Electron Diffraction Conference (1952), p. 32.Google Scholar
2 Kohler, T. H. and Farrish, W., “X-Ray Diffractometry of Radioactive Samples.” Review of Scientific Instruments, Vol, 26, 1955, p. 26.Google Scholar
3 Curnmings, W. V. Jr., Kaulitz, D. C., and Sanderson, M. J., “Double Diffractomg X-Ray Spectrometer for Study of Irradiated Materials.” Review of Scientific Instruments, Vol. 26, 1955, p. 5.Google Scholar
4 Bredig, M. A., Klein, G. E., and Borie, R. S. Jr., “X-Ray Diffractometer for Highly Radioactive Materials.” Review of Scientific Instruments, Vol. 36, 1955, p. 610.Google Scholar
5 Mueller, J. I., Mayes, R. E., and Simens, H. G., Internal company memorandum, January 2, 1957.Google Scholar