Hostname: page-component-7bb8b95d7b-s9k8s Total loading time: 0 Render date: 2024-09-29T19:51:33.779Z Has data issue: false hasContentIssue false

Impact of the Personal Computer on X-Ray Analysis Historical Perspective 1960-1990

Published online by Cambridge University Press:  06 March 2019

Ron Jenkins*
Affiliation:
International Centre for Diffraction Data Swarthmore, PA, USA
Get access

Extract

In these modern times, where the use of the computer in the analytical laboratory is taken for granted, it is perhaps difficult to realize that, less than one generation ago, computers were little more than an idea on an engineer's desk. It is interesting to note the sequence in which the automation of data collection and data processing developed. As would be expected, the time sequence followed closely the developments in computer hardware and peripherals. An important factor in the development of most commercial automated systems was the “20%” rule. This rule required that the total cost of any computer package should not exceed 20% of the sale price of the final automated product. Rex's “Numerical Control Powder Diffractometer” was described in the 1966 Denver Conference and this machine was to be the forerunner of a whole host of automated diffractometers which appeared in the early 1970s. Typical systems used either a 4K minicomputer or a time-sharing system with a large main-frame computer. It is interesting to observe that, as we come into the 1990s, the argument as to whether the main-frame will survive as a viable alternative to the rapidly developing PC still goes on.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] von Hevesey, G., “Chemical Analysis by X-rays and its Applications”, McGraw-Hill: New York (1932)Google Scholar
[2] Gillam, E. and Heal, H.T., Brit.J.Appl.Phys., 3:352 (1953)Google Scholar
[3] Segmüller, A., “Automated lattice parameter determination on single crystals”, Adv. X-ray Anal., 13:455(1969)Google Scholar
[5] Lucas-Tooth, H.L and Price, B.J., Metallurgia, 54:149 (1961)Google Scholar
[6] Lachance, G.R. and Traill, R.J., Can Spectrosc, 11:43 (1966)Google Scholar
[7] Criss, J.W. and Birks, L.S., Anal. Chem., 40:1080 (1968)Google Scholar
[8] Sherman, J., Spectrochim. Acta, 7:283 (1955)Google Scholar
[9] de Jongh, W.K., X-ray Spectrom., 2:151 (1973)Google Scholar
[10] Rex, R.W., “Numerical control X-ray powder diffractometer”, Adv.X-ray Anal., 10:366373(1966)Google Scholar
[11] Jenkins, R., Haas, D.J. and Paolini, F.R., “A new concept in automated powder diffractometry”, Norelco Reporter, 18:1 (1971)Google Scholar
[12] Johnson, G.G.Jr, and Vand, V., “A computerized powder diffraction identification system”, Ind. Eng. Chem., 59:19 (1967)Google Scholar
[13] IEEE Standard Modular Instrumentation and Digital Interface (CAMAC) IEEE-Std. 583 (1975) Inst, of Electrical and Electronic Engineers Inc., New YorkGoogle Scholar
[14] Rucklidge, J.R., “Automatic X-ray Fluorescence using CAMAC”, X-ray Spectrom., 7:57 (1978)Google Scholar
[15] Gunn, B.L., “The use of computers in X-ray Fluorescence analysisX-ray Spectrom., 5:175 (1976)Google Scholar