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A High-Temperature X-Ray Diffractometer Specimen Holder

Published online by Cambridge University Press:  06 March 2019

R. E. Dreikorn
R. E. Dreikorn*
Affiliation:
Avco Corporation, Wilmington, Massachusetts
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Abstract

A high-temperature X-ray diffractometer specimen holder that fits on a standard General Electric diffractometer is described. The thermal expansion of iridium from 23 to 1720°C is reported as 7.5 • 10−6−6 per °C and diagrams made at 2000°C are shown.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 5: Tenth Annual Conference on Applications of X-ray Analysis, August 7-9, 1961 , 1961 , pp. 213 - 220
Copyright
Copyright © International Centre for Diffraction Data 1961

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References

1. Mauer, F. and Bolz, L., “Measurement of Thermal Expansion of Cermet Components of High Temperature X-Ray Diffraction,” WADC TR55-473.Google Scholar
2. Holborn, L. and Valentiner, S., Ann. Physik, Vol. 22, 1907, p. 16.Google Scholar