Hostname: page-component-cd9895bd7-q99xh Total loading time: 0 Render date: 2024-12-25T02:35:03.409Z Has data issue: false hasContentIssue false
  • English
  • Français

High Spatial Resolution in X-Ray Fluorescence

Published online by Cambridge University Press:  06 March 2019

John D. Zahrt
John D. Zahrt*
Affiliation:
Applied Theoretical Physics Division, Los Alamos National Laboratory
Get access

Extract

During the past eight years or so there has been growing interest in using a polarized x-ray source in energy dispersive x-ray fluorescence spectrometers (1,2,3,4). The effect is to annihilate the source x rays before they scatter into the detector, thus significantly increasing the signal to noise ratio.

Both characteristic or Bremsstrahlung radiation can be polarized by 90° scattering from crystals (Bragg angle = 45°) or from amorphous materials respectively. This 90° polarizing scatter event greatly reduces the incident source radiation on a sample. In an effort to regain some intensity use is made of concave surfaces to utilize a manifold of beams (5,6,7).

Type
II. XRF Techniques and Instrumentation
Information
Advances in X-Ray Analysis , Volume 30: Thirty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-8, 1986 , 1986 , pp. 77 - 83
Copyright
Copyright © International Centre for Diffraction Data 1986

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

(1) Ryon, R., Adv. in X-Ray Anal., 20, 575–590 (1977).Google Scholar
(2) Aiginger, H. and Wobrausehek, P., J. Radioanal. Chem., 61, 281–293 (1981).Google Scholar
(3) Kirshke, P., Nuol. Inst. and Meth., A242, 566–568 (1986).Google Scholar
(4) Ryon, R. and Zahrt, J., Adv. in X-Ray Anal., 22, 453–460 (1979).Google Scholar
(5) Zahrt, J. and Ryon, R., Adv. in X-Ray Anal., 27, 505-511 (1984).Google Scholar
(6) Zahrt, J., Adv. in X-Ray Anal., 27, 513–517 (1984).Google Scholar
(7) Wobrausehek, P. and Aiginger, H., X-Ray Spectrom., 12, 72-78 (1983).Google Scholar
(8) Johann, H., Zeit. f. Phys., 69, 185-206 (1931).Google Scholar
(9) Zahrt, J., Adv. in X-Ray Anal., 26, 331-336 (1983).Google Scholar
(10) Zahrt, J., Nucl. Inst, and Meth., A242, 558-562 (1986).Google Scholar
(11) Johanson, T., Zeit. f. Phys., 82, 507-528 (1933).Google Scholar
(12) Nichols, M. and Ryon, R., Adv. in X-Ray Anal., 29, 423-426 (1986).Google Scholar
(13) Zachariasen, W., “ Theory of X-Ray Diffraction in Crystals”, Dover Publications, NewYork, 1967.Google Scholar