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A High Resolution Portable XRF HgI2 Spectrometer for Field Screening of Hazardous Metal Wastes

Published online by Cambridge University Press:  06 March 2019

M. Bernick ,
P. F. Berry ,
G. R. Voots ,
G. Prince ,
J. B. Ashe ,
J. Patel  and
P. Gupta
M. Bernick
Affiliation:
Roy F. Weston, Inc./REAC, Edison, New Jersey, 08837
G. R. Voots
Affiliation:
TN Technologies, Inc. Round Rock, Texas, 78664
G. Prince
Affiliation:
USEPA/Environmental Response Team, Edison, New Jersey, 08837
J. B. Ashe
Affiliation:
Ashe Analytics, Butte, Montana, 59711
P. Gupta
Affiliation:
Roy F. Weston, Inc./REAC, Edison, New Jersey, 08837
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Abstract

The use of a field portable XRF analyzer incorporating a semiconductor, mercuric iodide, energy dispersive spectrometer is described with emphasis on the benefits of high resolution x-ray detection for rapid screening of hazardous metallic wastes. Results are presented of “in-situ” and “prepared sample” soil measurement for different sites to show the potential of Fundamental Parameter analysis to obtain acceptable quality data with minimum calibration effort, obviating the need for site-specific standards.

Type
XIII. XRS Techniques and Instrumentation
Information
Advances in X-Ray Analysis , Volume 35 , Issue B: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 1047 - 1053
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

1. Fribush, H. M. and Fisk, J. F., “Field Analytical Methods for Superfund,” Proceedings of 2nd International Symposium onField Screening Methods for “Hazardous Wastes and Toxic Chemicals, Feb 12-14, 1991, Las Vegas, pp. 25-29. Google Scholar
2. Rabb, G. A., Kuharic, C. A., and Cole, W. H. III, “The Use of Field-Portable X-Ray Fluorescence Technology in the Hazardous Waste Industry,” Advance in X-Ray Analysis, Vol. 33, 629–637, 1990.Google Scholar
3. “Field Portable X-Ray Fluorescence,” U.S.EPA Quality Assurance Technical Information Bulletin, Vol.1, No.4, May, 1991.Google Scholar
4. Berry, P. F. and Voots, G. R., “On-Site Verification of Alloy Materials with a New Field Portable XRF Analyzer Based on a High-Resolution Hgl2 Semiconductor X-Ray Detector,” Proceedings of 12th World Conference on Non-Destructive Testing, Apr 23-28, 1989, Amsterdam, pp 737-742, Elsevier Science Pub.10.1016/B978-0-444-87450-4.50161-2Google Scholar
5. Ashe, J. B, Berry, P. F., Voots, G. R., Bernick, M., and Prince, G., “A High Resolution Portable XRF Hgl2 Spectrometer for Field Screening of Hazardous Metal Wastes,” Proceedings of 2nd Internationa) Symposium on Field Screening Methods for Hazardous Wastes and Toxic Chemicals, Feb 12-14, 1991, Las Vegas, pp. 507-515. Google Scholar