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A Generalized Matrix Correction Approach for Energy-Dispersive X-Ray Fluorescence Analysis of Paint Using Fundamental Parameters and Scattered Silver Kα Peaks

Published online by Cambridge University Press:  06 March 2019

Leif Højslet Christensen  and
Iver Drabæk
Leif Højslet Christensen
Affiliation:
Isotope Division, Risø National laboratory, DK-4000 Roskilde, Denmark
Iver Drabæk
Affiliation:
Danish Isotope Centre, Skelbaskgade 2, DK - 1717 Copenhagen V, Denmark
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Abstract

An energy-dispersive x-ray fluorescence method has been developed for the direct determination of major and minor elements in infinitely thick samples of paint. Matrix absorption and enhancement corrections are iteratively calculated from a knowledge of tabulated fundamental parameters and the unknown weight fractions. An estimate of the significant light element fraction of the bulk sample required for the calculation of matrix attenuation is obtained using the scatter peaks of the silver secondary target. Relative elemental calibration constants and calibration factors for the coherent and incoherent peaks are determined experimentally using either thin-film standards or standards of known total composition. For routine analysis only one absolute standard is required. The method has been applied to different types of paint with a relative standard deviation better than 5% provided the counting statistics are not the limiting factor. The accuracy has been tested by comparing own results with those obtained either from the formulation or from, instrumental neutron activation analysis.

Type
VII. XRF Computer Systems and Mathematical Corrections
Information
Advances in X-Ray Analysis , Volume 26: Thirty-First Annual Conference on Applications of X-ray Analysis, August 1-6, 1982 , 1982 , pp. 377 - 384
Copyright
Copyright © International Centre for Diffraction Data 1982

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References

1. Kamarchik, P., Jr. and Cunningham, G.P., “Applications of X-Ray Techniques to Coatings Analysis”, Progress in Organic Coatings 8 (1980) 81-107.Google Scholar
2. Chung, F.H., Lorentz, A.J. and Scott, R.W. “A Versatile Thin Film Method for Quantitative X-Ray Emission Analysis”, X-Ray Spectrom. 3 (1974) 172–2.Google Scholar
3. Cunningham, G.P., “Applications of X-Ray Techniques to Coatings of Lead in Paint using a Dedicated X-Ray Fluor escenoe Analyzer”, Proceedings of Fifth International Conference In Organic Coatings Science and Technology, 1979, 261–2, Adv. Org. Coat. Sci. Technol. Ser. Bd. S.Google Scholar
4. Kuntz, G.S. and Towns, R.L.R., “Determination of Lead in Paint by Energy Dispersive X-Ray Fluorescence Spectrometry”, J. Coatings Technol., 54 (1982) 63–69.Google Scholar
5. McMaster, W.H., Kerr del Grande, N., Mallett, J.H., and Hubbell, J.H., “Compilation of X-Ray Cross Sections”, UCRL 50174, (Secs. 1 and 2) (Rev. 1); Lawrence Radiation Laboratory, University of California, Livermore (1969).Google Scholar
6. Bambynek, W., Crasemann, B., Fink, R.W., Freund, H.U., Mark, H., Swift, C.O., Prince, R.E., and P. Venugopala Rao, “X-Ray Fluorescence Yields, Auger, and Coster-Kronig Transition Probabilities”, Rev. Mod. Phys. 44 (1972) 716–2.Google Scholar
7. Khan, Md. R. and Karirtd, M., “KfS/Ka; Ratios in Energy-dispersive X-Ray Emission Analysis”, X-Ray Spectrom. 9 (1980) 32-35.Google Scholar
8. Krause, M.O., Nestor, C.W., Jr., Sparks, C.J., Jr., and Ricci, E., “X-Ray Fluorescence Cross Sections for K and L X-Rays of the Elements”, ORNL-5399, Oak Ridge National laboratory, 1978.Google Scholar
9. Nielson, K.K., “Matrix Corrections for Energy Dispersive X-ray Fluorescence Analysis of Environmental samples with Coherent/Incoherent Scattered X-rays”, Anal. Chem. 49 (1977) 641–2.Google Scholar
10. Sparks, C.J., Jr., “Quantitative X-Ray Fluorescence Analysis using Fundamental Parameters”, Adv. X-Ray Anal. 19 (1976) 19-52.Google Scholar
11. Christensen, L.H. and Pind, N., “The Application of Energydispersive X-Ray Fluorescence and the Fundamental Parameter Approach to the Analysis of Ni-Fe-Cr Alloys”, X-Ray Spectrom. 10(1981) 156–2.Google Scholar
12. van Dyck, P.M. and Van Grieken, R.E., “Absorption Correction via Scattered Radiation in Energy-Dispersive X-Ray Fluorescence Analysis for Samples of Variable Composition and Thickness”, Anal. Chem. 52 (1980) 1859–24.Google Scholar