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Forty Years of Quantitative Diffraction Analysis

Published online by Cambridge University Press:  06 March 2019

Leroy E. Alexander*
Affiliation:
Carnegie-Mellon University Pittsburgh, Pennsylvania 15213
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Abstract

In this paper an attempt is made to review in rather broad perspective the origins and history of quantitative methods in diffraction analysis, at the same time leaving an in-depth examination of the present state of the art to other better qualified contributors to this conference. Space limitations preclude mention of many significant contributions, for which I am very sorry. It will be possible to review only a number of pivotal historical events, while also taking note of certain other researches that seem representative of historical and present-day trends.

The birth of quantitatively meaningful analysis in the mid-1930s depended upon a realisation of, and allowance for, the alteration of the diffracted intensities resulting from absorption of x-rays by the specimen. Furthermore, advances in the art achieved during the past forty years have been closely related to improvements in the treatment of the absorption factor.

Type
X-Ray Powder Diffraction
Copyright
Copyright © International Centre for Diffraction Data 1976

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References

1. Clark, G. L. and Reynolds, D. H., “Quantitative Analysis of Mine Dusts,” Ind. Eng. Chem., Anal.Ed. 8, 3640 (1936).Google Scholar
2. Scheibe, G., ChemischeSpektralanalyse, physikalischeMethoden der analytischenChemie. Vol. 1, p. 108, AkademischeVerlagsgesellschaft, Leipzig (1933).Google Scholar
3. Ballard, J. W., Oshry, H. I., and Schrenk, H. H., “Quantitative Analysis by X-ray Diffraction. I, Determination of Quartz,” U. S. Bur. Mines Repts.Invest., 3520 (June 1940).Google Scholar
4. Gardner, F. S., Cohen, M., and Antia, D. P., “Quantitative Determination of Retained Austenite by X-rays,” Trans. AIME 154, 306317 (1943).Google Scholar
5. Averbach, B. L. and Cohen, M., “X-ray Determination of Retained Austenite by Integrated Intensities,” Trans. AIME 176, 401415 (1948).Google Scholar
6. Ogilvie, R. E., “Retained Austenite by X-rays,” Norelco Reporter 6, No. 3, 6061 (1959).Google Scholar
7. Kelly, C. J. and Short, M. A., “A Paper Tape Controlled X-ray Diffractometer for the Measurement of Retained Austenite,” in Heinrich, K. F. J., Barrett, C. S., Newkirk, J. B., and Ruud, C. O., Editors, Advances in X-Ray Analysts, Vol. 15, pp. 102113, Plenum Press (1972).Google Scholar
8. Friedman, H., “Geiger Counter Spectrometer for Industrial Research,” Electronics 18, April 1945, pp. 132137.Google Scholar
9. Alexander, L. E. and Klug, H. P., “Basic Aspects of X-ray Absorption in Quantitative Diffraction Analysis of Powder Mixtures,” Anal. Chem. 20, 886889 (1948).Google Scholar
10. Klug, H. P., Alexander, L. E., and Kummer, E., “X-ray Diffraction Analysis of Crystalline Dusts,” J. Ind. Hyg.Toxicol. 30, 166171 (1948).Google Scholar
11. Klug, H. P., Alexander, I. E., and Kummer, E., “Quantitative Analysis with the X-ray Spectrometer,” Anal. Chem. 20, 607609 (1948).Google Scholar
12. Alexander, L. E., Klug, H. P., and Kummer, E., “Statistical Factors Affecting the Intensity of X-rays Diffracted by Crystalline Powders,” J. Appl. Phys. 19, 742754 (1948).Google Scholar
13. Leroux, J., Lennox, D. H., and Kay, K., “Direct Quantitative X-ray Analysis by Diffraction-Absorption Technique,” Anal. Chem. 25, 740743 (1953).Google Scholar
14. Lennox, D. H., “Monochromatic Diffraction-Absorption Technique for Direct Quantitative X-ray Analysis,” Anal.Chem. 29, 766770 (1957).Google Scholar
15. Leroux, J. and Mahmud, M., “Influence of Goniometric Arrangement and Absorption in Qualitative and Quantitative Analysis of Powders by X-ray Diffractometry,” Appl, Spectrosc. 14, 131134 (1960).Google Scholar
16. Ergun, S. and Tiensuu, V. H., “Determination of X-ray Absorption Coefficients of Inhomogeneous Materials,” J. Appl. Phys. 29, 946949 (1958).Google Scholar
17. Williams, P. P., “Direct Quantitative Diffractometric Analysis,” Anal.Chem. 31, 18421844 (1959).Google Scholar
18. Copeland, L. E. and Bragg, R. H., “Quantitative X-ray Diffraction Analysis,” Anal. Chem. 30, 196208 (1958).Google Scholar
19. Chung, F. H., “A New X-ray Diffraction Method for Quantitative Multicomponent Analysis,” in Grant, C. L., Barrett, C. S., Newkirk, J. B., and Ruud, C. O., Editors, Advances in X-Ray Analysis, Vol. 17, pp. 106115, Plenum Press (1974).Google Scholar
20. Chung, F. H., “Quantitative Interpretation of X-ray Diffraction Patterns of Mixtures. I. Matrix-Flushing Method for Quantitative Multicomponent Analysis,” J, Appl. Cryst. 7, 519525 (1974).Google Scholar
21. Berry, L. G. (ed.), Inorganic Index to the Powder Diffraction File, JCPDS, Philadelphia, 1970, pp. 11891196.Google Scholar
22. Clark, S. H. and Preston, S. J., “Dilution Methods in Quantitative X-ray Diffraction Analysis,” X-Ray Spectrometry 3, 2125 (1974).Google Scholar
23. J. J., Sahores, “New Improvements in Routine Quantitative Phase Analysis by X-ray Diffractometry,” in Birks, L. S., Barrett, C. S., Newkirk, J. B., and Ruud, C. O., Editors, Advances in X-Ray Analysis, Vol. 16, pp. 186197, Plenum Press (1973).Google Scholar
24. Leroux, J. and Powers, C. A., “Direct X-ray Diffraction Quantitative Analysis of Quartz in Industrial Dust Films Deposited on Silver Membrane Filters,” Occupational Health Review 21, 2634 (1970).Google Scholar
25. Bumsted, H. E., “Determination of Alpha-Quartz in the Respirable Portion of Airborne Particulates by X-ray Diffraction,” Amer. Ind, Hygiene Assoc. J. 34, 150158 (1973).Google Scholar
26. Crable, J. V., “Quantitative Determination of Chrysotile, Amosite andCrocidolite by X-ray Diffraction,” Amer. Ind. Hygiene Assoc. J. 27, 293298 (1966).Google Scholar
27. Rickards, A. L., “Estimation of Trace Amounts of Chrysotile Asbestos by X-ray Diffraction,” Anal. Chem. 44, 18721873 (1972).Google Scholar
28. Ferrell, R. E. Jr., “Applicability of Energy-Dispersive X-ray Powder Diffractometry to Determinative Mineralogy,” Amer, Mineral. 56, 18221831 (1971).Google Scholar
29. Mauer, F. A., private communication.Google Scholar
30. Voskamp, A. P., “High-Speed Retained Austenite Analysis with an Energy Dispersive X-ray Diffraction Technique,” in Grant, C. L., Barrett, C. S., Newkirk, J. B., and Ruud, C. O., Editors, Advances in X-Ray Analysis, Vol. 17, pp. 124138, Plenum Press (1974).Google Scholar
31. Richesson, M., Morrison, L., Cohen, J. B., and Paavo la, K., “An Inexpensive Computer Control for an X-ray Diffraction Laboratory,” J. Appl. Cryst. 4, 524527 (1971).Google Scholar
32. Jenkins, R., Haas, D. J., and Paolini, F. R., “A New Concept in Automated X-ray Powder Diffractometry,” Norelco Reporter 18, No, 2, 1227 (1971).Google Scholar
33. Slaughter, M., “A Modular Automatic X-ray Analysis System,” in Heinrich, K. F. J., Barrett, C. S., Newkirk, J. B., and Ruud, C. O., Editors, Advances in X-Ray Analysis, Vol. 15, pp. 135147, Plenum Press (1972).Google Scholar
34. Segmüller, A., “Automated X-ray Diffraction Laboratory System,” in Heinrich, K. F. J., Barrett, C. S., Newkirk, J. B., and Ruud, C. O., Editors, Advances in X-Ray Analysis, Vol. 15, pp. 114122, Plenum Press (1972).Google Scholar
35. King, P. J. and Smith, W. L., “A Computer-Controlled X-ray Powder Diffractometer,” J. Appl. Cryst. 7, 603608 (1974).Google Scholar
36. Jenkins, R., “Quantitative Analysis with the Automatic Powder Diffractometer,” Norelco Reporter 22. No. 1, 712 (1975).Google Scholar
37. Bragg, R. H., “Quantitative Analysis by Powder Diffraction,” in E. Kaelble, Editor, Handbook of X-Rays, Chap. 12, McGraw-Hill, New York (1967).Google Scholar
38. Jenkins, R., “Provision, Suitability and Stability of Standards for Quantitative Powder Diffractometry,” in Grant, C. L., Barrett, C. S., Newkirk, J. B., and Ruud, C. O., Editors, Advances in X-Ray Analysis, Vol. 17, pp. 3243, Plenum Press (1974).Google Scholar
39. Klug, H. P. and Alexander, L. E., X-Ray Diffraction Procedures, 2nd Ed., pp. 202206, 364-376, 540-544, Wiley, New York (1974).Google Scholar
40. Leroux, J., “Preparation of Thin Dust Coatings for Their Analysis by X-ray Emission and Diffraction,” Occupational Health Review 21, 1925 (1970).Google Scholar
41. Post, B., “Laboratory Hints for Crystallographers,” Norelco Reporter 20, No. 1, 8 (1973).Google Scholar