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Formalism for the Evaluation of Pseudo-Macro Stress Fields σ33(z) from Q-AND ψ-Mode Diffraction Experiments Performed with Synchrotron Radiation

Published online by Cambridge University Press:  06 March 2019

H. Ruppersberg
H. Ruppersberg*
Affiliation:
FB Werkstoffwissenschaften Universität des Saarlandes D-6600 Saarbrücken, Germany
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Abstract

A self-consistent scheme is proposed for the evaluation of stressfields which vary strongly within the penetration depth of the X-rays in polycrystalline specimens which are elastically isotropic and homogeneous on a macroscopic scale. Very precise diffraction experiments have to be performed for practical applications.

Type
VII. Stress Determination by Diffraction Methods
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 481 - 487
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

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