Hostname: page-component-78c5997874-xbtfd Total loading time: 0 Render date: 2024-11-05T08:11:20.881Z Has data issue: false hasContentIssue false

Fluorescence Analysis Using an Si (Li) X-Ray Energy AnalysisSystem With Low-Power X-Ray Tubes and Radioisotopes

Published online by Cambridge University Press:  06 March 2019

G. R. Dyer
Affiliation:
ORTEC, Incorporated Oak Ridge, Tennessee 37830
D. A. Gedcke
Affiliation:
ORTEC, Incorporated Oak Ridge, Tennessee 37830
T. R. Harris
Affiliation:
ORTEC, Incorporated Oak Ridge, Tennessee 37830
Get access

Extract

X-ray fluorescence spectroscopy has been in use since the early days of the twentieth century, when Moseley confirmed the order of the chemical periodic table. However, fluorescence spectroscopy until recently has depended on diffraction methods to obtain sufficient resolution. Intrinsic resolution of ionization chambers, scintillation detectors, and proportional counters is inadequate for discrimination o f lines due to adjacent elements of low atomic number. The advent o f solid-state detectors, especially those using lithium-compensated silicon and low-noise electronics, has recently brought intrinsic energy resolution to the point where lines from adjacent elements as light as carbon and nitrogen can be resolved in theory; and detection of K radiation from elements as light as sodium is practical. Thus the solution to the long-standing problem of an adequate detector is at hand, and energy-dispersive spectrometers are now feasible.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1971

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Moseley, N. G. J., “The High Frequency Spectra of the Elements,” Phil. Mag. 26, 1024 (1913). 27, 703 (1914).Google Scholar
2. Fano, U., “Ionization Yield of Radiations. II. The Fluctuations of the Number of Ions,” Phys. Rev. 72, 26 (1947).Google Scholar
3. Energy Dispersion X-Ray Analysis: X-Ray Probe and Electron Probe Analysis, Russ, J. C., coordinator, American Society for Testing and Materials, Special Technical Publication 485 (1971), contains more extensive information on solid-state spectrometers.Google Scholar
4. Rhodes, J. R., “Design and Application of X-Ray Emission Analyzers Using Radioisotope X-Ray or Gamma-Ray Sources,” in Russ, J. C., coordinator, op. cit., especially pages 245255, gives information on source geometry and radioisotope selection.Google Scholar
5. Goulding, F. S. and Jaklevic, J. M., “Trace Element Analysis by X-Ray Fluorescence,” UCRL-20625, UC-4 Chemistry, TID-4500 (57th ed.), reports a similar technique using a transmission anode tube.Google Scholar