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Excitation and Detection of High Energy Characteristic X-rays (20-90 KeV) Using a Novel Radiometric Technique*

Published online by Cambridge University Press:  06 March 2019

J. J. LaBrecque  and
P. A. Rosales
J. J. LaBrecque
Affiliation:
Instituto Venezolano de Investigaciones Cientfficas, IVIC Apartado 1827, Caracas 1010-A Venezuela
P. A. Rosales
Affiliation:
Instituto Venezolano de Investigaciones Cientfficas, IVIC Apartado 1827, Caracas 1010-A Venezuela
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Extract

Recently, we have developed a new radioisotope excited technique for x-ray fluorescence which employs “direct” beta particle excitation to produce characteristic x-rays for elemental analysis. We have also studied this technique with various other isotopes with different decay modes. But in all these previous works, we have only studied the x-ray energy region below the Bak lines (≤ 35 KeV), because of the poor efficiency of the Si(Li) semiconductor at higher energies.

In this work we have employed a planar Ge detector, which has about a 100% efficiency in the range of about 20 to 100 KeV. We have also compared this detector with a HgI2 detector, even though its resolution and efficiency is far less than the planar Ge detector.

Type
III. New Techniques and Instrumentation in XRF
Information
Advances in X-Ray Analysis , Volume 28: Thirty-Third Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1984 , 1984 , pp. 99 - 102
Copyright
Copyright © International Centre for Diffraction Data 1984

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References

1. LaBrecque, J.J., Parker, W.C. and Rosales, P.A., Radiochem. Radioanal. Letters, 49:261 (1981).Google Scholar
2. LaBrecque, J.J. and Parker, W.C., Adv. X-ray Anal., 26:337 (1983).Google Scholar
3. LaBrecque, J.J., Rosales, P.A. and Parker, W.C., J. Radioanal. Chem. 78:87 (1983).Google Scholar
4. Hale, D., Russ, J.C. and Leyden, D.E., Microbeam Analysis, 473 (1982).Google Scholar
5. Borowski, K., Priess, I.L., LaBrecque, J.J. and Pawley, C., Computer Enhanced Spectroscopy, 1:99 (1983).Google Scholar