Hostname: page-component-78c5997874-ndw9j Total loading time: 0 Render date: 2024-11-17T15:22:50.470Z Has data issue: false hasContentIssue false
  • English
  • Français

Evaluating Indirectly the X-Ray Tube Spectra on the Basis of the Fundamental Parameter Method in Wavelength-Dispersive X-Ray Spectrometry

Published online by Cambridge University Press:  06 March 2019

I. Szalóki  and
B. Magyar
I. Szalóki
Affiliation:
Lajos Kossuth University, Institute of Experimental Physics Debrecen, Bern tér 18/A, 4026 Hungary
B. Magyar
Affiliation:
Swiss Federal Institute of Technology Zurich, Laboratory of Inorganic Chemistry, Zurich, 8092 Switzerland
Get access

Extract

Several calibration methods and empirical formulae have been developed so far for analyzing materials quantitatively in XRF spectrometry. Many of them require reference samples to determine the relationship between the characteristic intensities of the elements and their concentrations. In order to eliminate empirical and semiempirical procedures, the fundamental parameter method (FPM) has been developed, which is one of the most helpful evaluating tools in quantitative XRF analysis. Some interpretations of this approach have the advantage that no standard samples are needed. The simultaneous application of FPM and polychromatic excitation demand an exact mathematical description of the primary spectral distribution as well as the efficiency function of the detector system.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 37: Forty-Second Annual Conference on Applications of X-ray Analysis, August 2-6, 1993 , 1993 , pp. 689 - 696
Copyright
Copyright © International Centre for Diffraction Data 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Castellano, E.E. and Rivera, B.E., X-Ray Spectrometry, 5, 223, (1976).Google Scholar
2. Brunetto, M.G. and Riveros, J.A., X-Ray Spectrometry, 13, 60, (1984).Google Scholar
3. Pella, P.A., F. Liangyimn and Small, J.A., X-Ray Spectrometry, 14, 125, (1985).Google Scholar
4. Ebel, H., Ebel, M.F., Wernisch, J., Poelm, Ch. and Wiederschwinger, H, X-Ray Spectrometry, 18, 89, (1989).Google Scholar
5. Tertian, R. and Broll, N., X-Ray Spectrometry, 13, 134, (1984).Google Scholar
6. Loomis, T.C. and Keith, H.D., X-Ray Spectrometry, 5, 104, (1976).Google Scholar
7. Brown, D.B., Gilfrich, J.V., and Peckcrar, M.C., Journal of Applied Physics, 46, 4537, (1975).Google Scholar
8. Arai, T., Shoji, T. and Omote, K., Adv. in X-Ray Analysis, 29, 413, (1986).Google Scholar
9. Görgl, R., Wobrauschek, P., Kregsamer, P. and Streli, Ch., X-Ray Spectrometry , 21, 37, (1992).Google Scholar
10. Rössiger, V., X-Ray Spectrometry, 17, 107, (1988).Google Scholar
11. Loomis, T.C. and Keith, H.D., Applied Spectroscopy, 29, 316, (1975).Google Scholar
12. Gilfrich, J.V., D.B, Brown, and Burkhalter, P.G., Applied Spectroscopy, 29, 322, (1975).Google Scholar
13. Vierling, J., Gilfrich, J.V., and Birks, L.S., Applied Spectroscopy, 23, 342, (1969).Google Scholar
14. Shiraiwa, T. and Fujino, N., Japanese Journal of Applied Physics, 5, 886, (1966).Google Scholar
15. Criss, J.W. and Birks, L.S., Analytical Chemistry, 40, 1080, (1968).Google Scholar
16. Szalóki, I., X-Ray Spectrometry, 20, 297, (1991).Google Scholar
17. Arai, T., X-Ray Spectrometry, 20, 9, (1991)Google Scholar