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The Estimation of Limits of Detection in RIM Quantitative X-Ray Diffraction Analysis

Published online by Cambridge University Press:  06 March 2019

Briant L. Davis
Briant L. Davis*
Affiliation:
Cloud Physics Laboratory Institute of Atmospheric Sciences South Dakota School of Mines and Technology 501 E. St, Joseph Street Rapid City, SD 57701
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Extract

In earlier papers, the reference intensity method (RIM) of quantitative x-ray diffraction was described in terms of the theoretical basis (Davis, 1980), error propagation (Davis, 1981), filter sample preparation technology for eliminating preferred orientation (Davis and Johnson, 1982; Davis, 1986), and special applications to amorphous-bearing samples using mass absorption measurements (Davis and Johnson, 1987). This paper describes application of counting statistics to the determination of the lower limit of detection (LLD) of components quantitatively measured by the RIM procedure. With this discussion, virtually all phases of the RIM methodology will have been described.

Type
IV. Quantitative and Qualitative XRD Phase Analysis
Information
Advances in X-Ray Analysis , Volume 31: Thirty-Sixth Annual Conference on Applications of X-ray Analysis, August 3-7, 1987 , 1987 , pp. 317 - 323
Copyright
Copyright © International Centre for Diffraction Data 1987

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References

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