It is with a profound sense of the historical context of this morning that I share this podium with three people who are very much responsible for our ability to rapidly identify and characterize solids. In order to do such solids analysis, we need an instrument that provides the necessary diffraction data and a set of reference patterns for comparison to those we measure, along with a means of rapidly accessing those patterns to make our identifications. I do not need to tell this audience that I am alluding to the diffractometer developed by our Session Chairman, Bill Parrish, in the 1940's and to the milestone publications by Hanawalt, Rinn and Frevel in the 1930's that gave us the first 1000 patterns of the database that was to become the Powder Diffraction File, and the search method later called the Hanawalt Method.