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Energy Dispersive X-Ray Fluorescence Spectrometry at High Count Rates: Pulsed Tube Excitation and Recovery of Resolution by Computer Processing

Published online by Cambridge University Press:  06 March 2019

J . E. Stewart ,
H. R. Zulliger  and
W. E. Drummond
J . E. Stewart
Affiliation:
Nuclear Semiconductor Mountain View, California 94043
H. R. Zulliger
Affiliation:
Nuclear Semiconductor Mountain View, California 94043
W. E. Drummond
Affiliation:
Nuclear Semiconductor Mountain View, California 94043
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Abstract

Energy dispersive X-ray spectrometry has the potential for making very rapid analyses of multi-element samples. In order to fully exploit this capability several studies have been carried out with the goal of improving performance at high input count rates. A refined amplifier permits operation at input count rates up to 80000 per second with minimal peak shift and distortion. Optimum choice of tube parameters and filters permits utilization of a single Mo transmission target tube to analyze a broad range of elements in minimum time. Use of a pulsed tube further reduces the time required for analysis without sacrifice of precision or resolution. Dead time necessarily increases with increasing input count rate. It can be reduced by selecting a short amplifier time constant, but only with a loss of resolution. Digital processing permits recovery of the lost resolution. Some illustrations are given of spectra that have been processed on-line using a computer based multi-channel analyzer.

Type
Mathematical Correction Procedures for X-Ray Spectrochemical Analysis
Information
Advances in X-Ray Analysis , Volume 19: Twenty-Fourth Annual Conference on Applications of X-ray Analysis, August 6-8, 1975 , 1975 , pp. 153 - 160
Copyright
Copyright © International Centre for Diffraction Data 1975

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References

1. Reed, S. J. B., “Pulse Pile-up Rejection in Si(Li) X-ray Detection Systems”, J . Phys. E. 5, 997 (1972).Google Scholar
2. Jaklevic, J. M., Goulding, F. S., and Landis, D. A., “High Rate X-ray Fluorescence Analysis by Pulsed Excitation”, IEEE Tran s.NucL Sci. 19. No. 3, 392 (1972).Google Scholar
3. Zulliger, H. R. and Stewart, J. E., “X-ray Fluorescence Analysis with Transmission Target Tube s”, in Pickles, W. J., Newkirk, J. B., Barrett, C. S., and Ruud, C. O.(eds), Advances in X-ray Analysis, vol. 18, 278, Plenum Press (1975).Google Scholar
4. Stewart, J. E., “Resolution Enhancement of X-ray Fluorescence Spectra with a Computerized Multichannel Analyzer”, Appl. Spect, 29, 171 (1975).Google Scholar
5. Burger, H. C. and Cittert, P. H. van, “Wahre und Scheinbare Inensitatsverteilung in Spektrallinien”, Physik, Z. 79. 722 (1932); 81, 428 (1933).Google Scholar