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Energy Dispersive X-ray Diffractometry

Published online by Cambridge University Press:  06 March 2019

Michael Mantier  and
William Parrish
Michael Mantier
Affiliation:
IBM Research Laboratory San Jose, California 95193
William Parrish
Affiliation:
IBM Research Laboratory San Jose, California 95193
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Abstract

This paper describes the principles, methods, instrumentation and results of EDXKD and a computer method of profile fitting to obtain corrected intensities and peak energies from isolated and overlapping reflections. The profile, P, of a diffraction peak is a convolution of the incident X-ray spectrum, X, the geometrical aberrations, T, the contribution from the specimen, S, and the detector resolution function, D.

Type
X-Ray Powder Diffraction
Information
Advances in X-Ray Analysis , Volume 20: Twenty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-6, 1976 , 1976 , pp. 171 - 186
Copyright
Copyright © International Centre for Diffraction Data 1976

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References

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