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Energy Dispersive Measurement of X-Ray Tube Spectra

Published online by Cambridge University Press:  06 March 2019

H. Aiginger ,
M. Benedikt  and
R. Görgl
H. Aiginger
Affiliation:
Atominstitut der Österreichischen Universitäten Schüttelstraße 115, A-1020 Wien, Austria
M. Benedikt
Affiliation:
Atominstitut der Österreichischen Universitäten Schüttelstraße 115, A-1020 Wien, Austria
R. Görgl
Affiliation:
Atominstitut der Österreichischen Universitäten Schüttelstraße 115, A-1020 Wien, Austria
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Abstract

A method for measuring spectral distributions of x-ray tubes directly with a solid-state detector is presented. Different anode materials (chromium, molybdenum, rhodium and tungsten) have been measured. Results for various applied voltages and take-off angles have been obtained.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 39: Forty-Fourth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1995 , 1995 , pp. 137 - 147
Copyright
Copyright © International Centre for Diffraction Data 1995

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References

1. Placious, R., J. Appl. Phys. 38, 2030 (1967).Google Scholar
2. Gilfrich, J. V. and Birks, L. S., Anal. Chem. 40, 1077(1968).Google Scholar
3. Gilfrich, J. V., Burkhaiter, P. G., Whitlock, R. R., Warden, E. S. and Birks, L. S., Anal. Chem. 43, 934 (1971).Google Scholar
4. Brown, D. B. and Gilfrich, J. V., J. Appl. Phys. 42, 4044 (1971).Google Scholar
5. Gilfrich, J. V. in Handbook of Spectroscopy, edited by Robinson, J. W., Vol. 1, p. 232, CRC Press, Cleveland, OH (1974).Google Scholar
6. Rao-Sahib, T. S. and Wittry, D. B., J. Appl Phys. 45, 5060(1974).Google Scholar
7. Brown, D. B., Gilfrich, J. V. and Peckarar, M. C., J. Appl. Phys. 46, 4537 (1975).Google Scholar
8. Fiori, C. E., Myklebust, R. L., Heinrich, K. F. J. and Yakovitz, H., Anal. Chem. 48, 172 (1976).Google Scholar
9. Loomis, T. C. and Keith, H. D., X-Ray Spectrom. 5, 104 (1976).Google Scholar
10. Statham, P. J., X-Ray Spectrom. 5, 154(1974).Google Scholar
11. Smith, D. G. W. and Reed, S. J. B., X-Ray Spectrom. 10, 198(1981).Google Scholar
12. Kramer, H. M. and Von Seggern, H., Nucl. Instr. Meth. 213, 373 (1983).Google Scholar
13. Pella, P. A., Feng, L. and Small, J. A., X-Ray Spectrom. 14, 125 (1985).Google Scholar
14. Arai, T., Shoji, T. and Omote, K., Adv. X-Ray Anal. 29, 413 (1986).Google Scholar
15. Tominaga, S., Nucl. Instr. Meth. A243, 530 (1986).Google Scholar
16. Mainardi, R. T. and Barrea, R. A., Nucl. Instr. Meth. A280, 387 (1989).Google Scholar
17. Honkimäki, V., Sleight, J. and Suortti, P., J. Appl. Cryst. 23, 412 (1990).Google Scholar
18. Ebel, H., Wiedersch winger, H., Wernisch, J. and Pella, P. A., Adv. X-Ray Anal. 35, 721 (1992).Google Scholar