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Elemental X-Ray Imaging of Fossils
Published online by Cambridge University Press: 06 March 2019
Abstract
This paper describes the imaging of fossils using elemental x-ray area mapping (EXAM). The technique utilizes a commercially available instrument originally designed for the silicon chip industry. The EXAM data are processed digitally with imaging software to remove surface irregularities and enhance specimen details. Applications of this technique to specimens with irregular surfaces are described.
- Type
- III. XRS Techniques and Instrumentation
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- Copyright © International Centre for Diffraction Data 1992
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