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Elemental Analysis of Geological Samples Using a Multichannel, Simultaneous X-Ray Spectrometer

Published online by Cambridge University Press:  06 March 2019

J. B. Cross
Affiliation:
Phillips Petroleum Company, Bartlesville, OK 74004
L. V. Wilson
Affiliation:
Phillips Petroleum Company, Bartlesville, OK 74004
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Extract

X-ray spectrometry has been used successfully for major and trace element analysis of geological samples (e.g. reference 1). Its advantage is providing accurate and precise results in a rapid manner: a key factor in selecting analytical methods for mineralogical studies involving large numbers of samples. All elements with atomic numbers greater than 9 (fluorine), except noble gases, can be determined with sensitivities ranging down to ppm levels.

The analytical method described in this report is for the determination of the major elements (i.e. Na, Mg, Al, Si, P, K, Ca, Ti, Mn and Fe) in geological samples. Commercially available automated fusion devices are used for sample preparation.

Type
VIII. XRF General Applications
Copyright
Copyright © International Centre for Diffraction Data 1982

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References

1. Hutton, J. T. and Elliott, S. M., Chemical Geology, 29:111 (1980).Google Scholar
2. Abbey, S., Geological Survey of Canada, Paper 80-14, Part 6 . 1979 Edition of “Usable” Values, (1980).Google Scholar
3. Plesch, R., Siemens X-Ray Analytical Application Note No. 28, Siemens Corp.Google Scholar