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The Effects of Sampling Error on Detection Limits Determined for Quantitative X-Ray Diffraction

Published online by Cambridge University Press:  06 March 2019

Gregory A. Raab  and
Peggy Dalheim
Gregory A. Raab
Affiliation:
AWC, A Lockheed Company, Las Vegas, NV, USA
Peggy Dalheim
Affiliation:
The Mineral Lab, Denver, CO, USA
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Abstract

This paper investigates the contributions of sample preparation to the analytical lower limits of detection and errors for the quantitative X-ray diffraction analysis of a simple, binary system of quartz and calcite. This study further demonstrates the danger of using only statistical and instrumental contributions to detection limits and analytical errors.

Type
II. Quantitative Phase Analysis by X-Ray Diffraction (XRD)
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 91 - 103
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

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