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Direct X-Ray Measurement of Residual Strains in Textured Steel

Published online by Cambridge University Press:  06 March 2019

C. P. Gazzara*
Affiliation:
Army Materials & Mechanics Research Center, Watertown, Massachusetts 02172
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Extract

One of the most detrimental effects on the accuracy of an X-ray diffraction residual stress analysis, XRDRSA(l), is found in the examination of textured materials. The degree of elastic anisotropy and texture is in general agreement with the extent of the error in the residual stress. Several approaches have been made to correct for the effects of texture, particularly involving experimental techniques. Reviews of such efforts are given by H. D811e(2), v.M. Hauk﹛3) and G. Maeder, J.L. Lebrun and J.M. Sprauel (4), just to mention a few.

A brief chronology of the texture corrections involved in XRDRSA follows. With isotropic materials the d spacing of a crystal lattice, d, is assumed to vary linearly with sin2ψ. With textured materials the d vs sin2ψ relationship is nonlinear. This is due to the anisotropy of the elastic constants and their departure from a random distribution, or taking on a preferred orientation.

Type
II. X-Ray Strain and Stress Determination
Copyright
Copyright © International Centre for Diffraction Data 1983

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References

1. “Residual Stress Measurement by X-ray Diffraction”, SAEJ784a, Society of Aut. Engrs. Inc., Warrendale, PA (1971)Google Scholar
2. Dolle, H., The Influence of Multiaxial Stress States, Stress Gradients and Elastic Anisotropy on the Evaluation of Residual Stress by X-rays, J. appl. Cryst, 12:489(1979).Google Scholar
3. Hauk, V. M., X-ray Methods for Measuring Residual Stress, Sagamore Army Materials Proc., 28:117, Plenum Press, New York (1982).Google Scholar
4. Maeder, G., Lebrun, J. L., and Sprauel, J. M., Present Possibilities for the X-ray Diffraction Method of Stress Measurement, NDTITDS, 14:235(1981).Google Scholar
5. Marion, R. H., and Cohen, J. B., Anomalies in Measuranent of Residual Stress by X-ray Diffraction, Adv. X-ray Anal., 18:466 (1975).Google Scholar
6. Shiraiwa, T., and Sakamoto, Y., The X-ray Stress Measurement of the Deformed Steel Having Preferred Orientation, Soc. Mat. Sci., 25, Kyoto, Japan(1970).Google Scholar
7. Hauk, V., and Sesemann, H., Abweichungen von Linearen Gitterbenenabstandsverteilungen in Kublschen Metallen und ibre Berucksichtigung bie der Rontgenographischen Sparmungermittlung, Z. Metallk. 67:646 (1976).Google Scholar
8. Dolle, H., and Hauk, V., Einfluss der Mechanischen Anisotropie de Vielkristalls (Textur) auf die Rontgenogriphische Sparmungermittlung, Z. Metallk. 69:410(1978).Google Scholar
9. Dolle, H., and Cohen, J. B., Evaluation of Residual Stresses in Textured Cubic Metals, Met, Trans. A., 11A:831(1980).Google Scholar
10. Gazzara, C. P., X-ray Residual Stress Measurement Systems for Array Material Problems, Sagamore Array Materials Proc., 28:369, Plenum Press, New York(1982).Google Scholar
11. Gazzara, C. P., The Measurement of X-ray Residual Stress in Textured Cubic Materials, Proc. Fall Mtg., SESA, Keystone, CO, 32(1981).Google Scholar
12. Jaensson, B., A Principal Distinction Between Different Kinds of X-ray Equipment for Residual Stress Measurement, Mat. Sci. and Engrg., 43:169(1980).Google Scholar