Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-23T14:04:28.841Z Has data issue: false hasContentIssue false
  • English
  • Français

Direct Display of X-ray Topographic Images

Published online by Cambridge University Press:  06 March 2019

Green Robert E Jr.
Green Robert E Jr.*
Affiliation:
Department of Mechanics and Materials Science The Johns Hopkins University Baltimore, Maryland 21218
Get access

Abstract

The purpose of the present paper is to give a comprehensive state of the art review of all electro-optical systems used to date for direct viewing of X-ray topographic images. Consideration is given to both direct conversion X-ray sensitive vidicon systems and to indirect conversion systems which use fluorescent screens to convert the X-ray image into a visible one. Included in this review is a discussion of the relative advantages and disadvantages of the various electro-optical systems, including cost, versatility, portability, simplicity of operation, sensitivity, and resolution capability.

Type
X-Ray Topography
Information
Advances in X-Ray Analysis , Volume 20: Twenty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-6, 1976 , 1976 , pp. 221 - 235
Copyright
Copyright © International Centre for Diffraction Data 1976

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Green, R. E. Jr., “Electro-Optical Systems for Dynamic Display of X-ray Diffraction Images,” in Barrett, C. S., Newkirk, J. B., and Ruud, C. O., Editors, Advances in X-ray Analysis, Vol. 14, p. 311–337, Plenum Press (1971).Google Scholar
2. Chikawa, J. and Fujimoto, I., “X-ray Diffraction Topography with a Vidicon Television Image System,” Appl. Phys. Lett. 13, 387–389 (1968).Google Scholar
3. Chester, A. N. and Koch, F. B., “Instantaneous Display of X-ray Diffraction Using a Diode Array Camera Tube,” in Barrett, C. S., Newkirk, J. B., and Mallett, G. R., Editors, Advances in X-ray Analysis, Vol. 12, p. 165–173, Plenum Press (1969).Google Scholar
4. Rozgonyi, G. A., Haszlo, S. E., and Statile, J. L., “Instantaneous Video Display of X-ray Topographic Images with Resolving Capabilities Better than 15μ,” Appl. Phys. Lett. 16, 443–446 (1970).Google Scholar
5. Meieran, E. S., Landre, J. K., and Hara, S. O., “Direct Video Imaging of X-ray Topographs,” Appl. Phys. Lett. 14, 368–371 (1969).Google Scholar
6. Lang, A. R. and Reifsnider, K., “Rapid X-ray Diffraction Topography Using a High-Gain Image Intensifier,” Appl. Phys. Lett. 15, 258–260 (1969).Google Scholar
7. Reifsnider, K., “Time-Resolved X-ray Diffraction Microscopy: Development of a New Technique,” Department of Engineering Mechanics, Virginia Polytechnic Institute, DEMVIF Rept. No. 4-2 (1969).Google Scholar
8. Chikawa, J., Fujimoto, I., and Abe, T., “X-ray Topographic Observation of Moving Dislocations in Silicon Crystals,” Appl. Phys. Lett. 21, 295–298 (1972).Google Scholar
9. Chikawa, J., Fujimoto, I., Endo, S., and Mase, K., “X-ray Television Topography for Quick Inspection of Si Crystals,” in Huff, H. R. and Burgess, R. R., Editors, Semiconductor Silicon 1973, p. 448, Electrochemical Society, Princeton (1973).Google Scholar
10. Chikawa, J. and Fujimoto, I., “Video Display Technique for X-ray Diffraction Topography,” Nippon Hoso Kyokai (Japan Broadcasting Corporation) Technical Research Laboratories, Technical Monograph No. 33, March (1974).Google Scholar
11. Chikawa, J., “Live Topography Using a Television System,” International Summer School on X-ray Dynamical Theory and Topography, Limoges, France, August (1975).Google Scholar
12. Chikawa, J., NHK Technical Research Laboratories, 1-10-11, Kinuta, Setagaya-ku, Tokyo 157, Japan (private communication).Google Scholar
13. Imura, T., Department of Metallurgy, Faculty of Engineering, Nagoya University, Furo-cho, Chikusa-Ku, Nagoya 464, Japan (private communication).Google Scholar
14. Rigaku/USA Lakeside Office Park, Door 16 607 North Avenue Wakefield, Massachusetts 01880.Google Scholar
15. Meieran, E. S., “The Application of X-ray Topographical Techniques to the Study of Semi-conductor Crystals and Devices,” Siemens Review, Fourth Special Issue, Vol. 37 (1970).Google Scholar
16. Meieran, E. S., “Video Display of X-ray Images 1. X-ray Topographs,” J. Electrochem. Soc. 118, 619–631 (1971).Google Scholar
17. Hashizume, H., Kohra, K., Yamaguchi, T., and Kinoshita, K., “Application of an Image Orthicon Camera Tube to X-ray Diffraction Topography Utilizing the Double-Crystal Arrangement,” Appl. Phys. Lett. 18, 213–214 (1971).Google Scholar
18. Hashizume, H., Ishida, H., and Kohra, K., “A Study on Equal-Thickness Fringes in a Silicon Crystal by Means of an X-ray Video Imaging Device,” Japan. J. Appl. Fhys. 10, 514–515 (1971).Google Scholar
19. Kozaki, S., Hashizume, H., and Kohra, K., “High Resolution Video Display of X-ray Topographs with the Divergent Laue Method,” Japan. J. Appl. Phys. 11, 1514-1521 (1972).Google Scholar
20. Hashisume, H., Kohra, K., Yamaguchi, T., and Kinoshita, K., “A Few Applications of an X-ray Television System to Diffraction Studies,” in Shinoda, G., Kohra, K., and Ichinokawa, T., Editors, Proceedings of the Sixth International Conference on X-ray Optics and Microanalysis, p. 695–701, University of Tokyo Press (1972).Google Scholar
21. Hartmann, W., Markiewitz, G., Rettenmaier, U., and Queisser, H. J., “High-resolution direct-display X-ray topography,” Appl. Phys. Lett. 27, 308–309 (1975).Google Scholar
22. Vreeland, T. Jr., Keck, W. M. Laboratory of Engineering Materials, California Institute of Technology, Pasadena, California 91125 (private communication).Google Scholar
23. K.Reifsnider, , “Recent Developments in the Use of High-Gain Optical Image Intensifiers for High-Speed Photography of Dynamic X-ray Diffraction Patterns,” J. Soc. Motion Picture and Television Engineers 80, 18–22 (1971).Google Scholar
24. Lang, A. R., “A Versatile Electronic Image Intensification System for X-ray Topography,” J. Phys. E: Sci. Instrum. 4, 921–922 (1971).Google Scholar
25. Parpia, D. Y. and Tanner, B. K., “Display of X-ray Topographic Images Using a Channel Plate,” phys. stat. sol. (a) 6, 689–692 (1971).Google Scholar
26. Vreeland, T. Jr., and Lau, S. S., “A Simple Image Intensifying System far Berg-Barrett Topography,” Rev. Sci. lnstrum. 46, 41–43 (1975).Google Scholar
27. Green, R. E. Jr., Farabaugh, E. N., and Crissman, J. M., “X-ray Topographic Examination of Large Paraffin Single Crystals,” J. Appl. Phys. 46, 4173-4180 (1975).Google Scholar
28. Boettinger, W. J., Burdette, H. E., Kuriyama, M., and Green, R. E. Jr., “Asymmetric Crystal Topographic Camera,” Rev. Sci. Instrum. 47 906–911 (1976).Google Scholar
29. Biberman, L. M. and Nudelman, S., Editors, Photoelectronic Imaging Devices, Plenum Press (1971).Google Scholar
30. Marton, L., Editor, Advances in Electronics and Election Physics, Vol. 12 (1960), Vol. 16 (1962), Vol. 22 (1966), Vol. 28 (1969), Vol. 33 (1972), Academic Press.Google Scholar