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Differential Photoionization Cross Section of Neon Subshells for the X-Ray Analysis by Photoelectron Spectrometry

Published online by Cambridge University Press:  06 March 2019

François Wuilleumier
François Wuilleumier*
Affiliation:
Transuranium Research Laboratory, Oak Ridge National, Laboratory, Oak Ridge, Tennessee 37830
*
†Guest Scientist from Laboratoire de Chimie Physique de l'Université Paris VI, ll rue Pierre et Marie Curie, Paris, France. (present address).
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Abstract

The new x-ray analysis method using photoeleetron spectrometry demands knowledge of differential photoionization cross sections of the subshells of the converter atoms used as intermediary between the x-ray spectrum and the photoelectron spectrum. These differential cross sections were determined for the most appropriate converter, the neon atom, in the energy range from 50 to 3000 eV. The total photoionization cross section was partitioned into contributions that arise from single ionization in the various subshells and from multiple processes. We present in tabular and graphical form: a) 1s, 2s and 2p total subshell cross sections; b) 1s, 2s and 2p differential cross sections at 54.73°; and c) ls, 2s and 2p differential cross sections at 90°. Accuracy is considered to be better than 3%, 7% and 5% at all energies for 1s, 2s and 2p cross sections, respectively.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 16: 'Twenty-First Annual Conference on Applications of X-ray Analysis, August 2-4, 1972 , 1972 , pp. 63 - 73
Copyright
Copyright © International Centre for Diffraction Data 1972

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