Hostname: page-component-78c5997874-t5tsf Total loading time: 0 Render date: 2024-11-19T15:12:39.319Z Has data issue: false hasContentIssue false
  • English
  • Français

Design and Applications of a Variable-Temperature Diffractometer Specimen Mount

Published online by Cambridge University Press:  06 March 2019

William L. Baun
William L. Baun*
Affiliation:
Wright Air Development Division, Dayton, Ohio
Get access

Abstract

A design is described for a variable-temperature diffractometer specimen mount developed internally in the Physics Laboratory of Materials Central. Temperature capability of 1600°C is achieved using Indirect radiation heating. Higher temperatures may be obtained by directly heating the sample. An adaptation allows operation at temperatures as low as −196°C and is useful for studying low-temperature phase changes and examining materials normally liquid at room temperature. The mount operates in vacuum or inert atmosphere. A full 180° 2θ scanning range is possible through the use of curved beryllium- or aluminum-foil windows. Realignment of the sample at temperature and under vacuum may be accomplished from four points around the front plate of the mount. Only two vacuum seals are used In this mount in addition to the window seal and thermocouple seals. Power for the mount is high current, low voltage, and is controlled by an automatic temperature regulator and sensing device which maintains an accurate preset temperature.

Applications of variable temperature techniques on refractory metals, alloys, and compounds are shown, along with an example of low-temperature effects in materials normally liquid at room temperature.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 4: Ninth Annual Conference on Applications of X-ray Analysis, August 10-12, 1960 , 1960 , pp. 201 - 211
Copyright
Copyright © International Centre for Diffraction Data 1960

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Peiser, H. S., Rooksby, H. P.. and Wilson, A. J. C., Ed., “X-Ray Diffraction by Polycrystalline Materials,” The Institute of Physics, London, 1955, pp. 242–264.Google Scholar
2. Chiotti, P., “Adaptation of a Geiger Counter X-Ray Diffractometer for High Temperature Investigations,” Rev. Sci., Instr., Vol. 25, 1954, p. 683.Google Scholar
3. Mauer, F. A. and Bolz, L. H., “Measurement of Thermal Expansion of Cermet Components by High Temperature X-Ray Diffraction,” WADC Technical Report 55-473. December 1955 and WADC Technical Report 55-473, Supplement 1, June 1957, (Also National Bureau of Standards Report No. 5837.)Google Scholar
4. Perri, J. A., Banks, E., and Post, B., “Study of Phase Transitions in WO3 with a High Temperature X-Ray Diffractometer,“ J. Appl. Physics, Vol. 28, 1957, p. 1272.Google Scholar
5. Hume-Rothery, W. and Reynolds, P. W., “A High Temperature Debye-Scherrer Camera and Its Application to the Lattice Spacing of Silver,” Proc. Roy. Soc. (London), Ser. A, Vol. 167, 1938, p, 25.Google Scholar
6. Renton, J. J. and Baun, W. L., unpublished results.Google Scholar
7. Hartley, C., Baun, W., and Fischer, D., WADD Technical Report, to be published.Google Scholar
3. Glaser, F. W., Moskowitz, D., and Post, B., “A Study of Some Binary Hafnium Compounds,” J. Metals, Vol. 5, 1953, p. 1119.Google Scholar
9. Austin, J. B., “Thermal Expansion of Nonmetallic Crystals,” J. Am. Ceram. Soc, Vol. 35, 1952, p, 243.Google Scholar
10. Baim, W. L.. “X-Ray Diffraction Study of Straight ChainCarboxylie Acids,” WADD Technical Report 59-782, July 1960.Google Scholar