Hostname: page-component-586b7cd67f-rcrh6 Total loading time: 0 Render date: 2024-11-23T11:51:27.121Z Has data issue: false hasContentIssue false
  • English
  • Français

Computer-Aided Qualitative X-Ray Powder Diffraction Phase Analysis

Published online by Cambridge University Press:  06 March 2019

Raymond P. Goehner  and
Mary F. Garbauskas
Raymond P. Goehner
Affiliation:
General Electric Corporate Research and Development, P.O. Box 8, Schenectady, NY 12301
Mary F. Garbauskas
Affiliation:
General Electric Corporate Research and Development, P.O. Box 8, Schenectady, NY 12301
Get access

Abstract

This paper describes a set of interactive computer programs written in FORTRAN IV and implemented on a POP 11/34 equipped with RLO-2 ten Mbyte discs and an RSX-11M operating system to assist in x-ray diffraction phase analysis. The packing of the data base will be described along with the various interactive programs that access it. The search/match package is designed more as a set of aids for the diffractionist rather than as a single totally automated search/match program, the procedure adapted by many of the xray diffraction (XRD) equipment manufacturers. The approach taken allows the analyst to direct the analysis procedure by utilizing different search/match programs or specifying various options within a given program.

Type
II. Search/Match Procedures, Powder Diffraction File
Information
Advances in X-Ray Analysis , Volume 26: Thirty-First Annual Conference on Applications of X-ray Analysis, August 1-6, 1982 , 1982 , pp. 81 - 86
Copyright
Copyright © International Centre for Diffraction Data 1982

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Nichols, M.C. and Johnson, Q., Adv. X-Ray Anal., Vol. 23, pp. 273–278, 1980.Google Scholar
2. Frevel, L.K., Anal. Chem., Vol. 37, pp. 471–482, 1965.Google Scholar
3. Nichols, M.C., UCRL-70078, Lawrence Livermore Laboratory, 1966.Google Scholar
4. Johnson, G.C. and Vand, V., Ind. Eng, Cham. Vol. 59, pp. 19–31, 1967.Google Scholar
5. Hanawalt, J.D., Rinn, H. and Frevel, L.K., Ind. Eng. Chem. Ed., Vol. 10, pp. 457–512, 1939.Google Scholar
6. Snyder, R.L., Adv. X-Ray Anal. Vol. 24, pp. 83–89, 1980.Google Scholar
7. Sparks, R.A., to be published in Adv. X-ray Anal., 1983.Google Scholar
8. Goehner, R.P., Adv. X-Ray Anal., Vol. 23, pp. 305–311, 1980.Google Scholar
9. Goehner, R.P., GE Technical Information Series, 82CR0114, 1982.Google Scholar
10. McCarthy, G.J. and Johnson, G.G., Jr., Adv. X-Ray Anal., Vol. 22, pp. 109–119, 1979,Google Scholar