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A Comprehensive Approach to in Situ Stress Measurement

Published online by Cambridge University Press:  06 March 2019

R. A. Holt*
Affiliation:
Physical Metallurgy Research Laboratories Canada Centre for Mineral and Energy Technology, Ottawa Energy, Mines and Resources, Canada
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Extract

Recent developments in position sensitive detectors (PSD's), solid state power and computer technologies make it possible to design accurate instruments for in-situ stress measurement. Such instruments require compromises in the interests of portability, size and speed stiich may limit accuracy and/or versatility. Furthermore, extraction of a stress tensor from X-ray data is not always straightforward and considerable research is required before an instrument for X-ray stress measurement can be treated as a “black box” to be given to an uneducated operator.

The development of a new instrument for in-situ stress measurement is described in this paper. It was conceived as a field instrument with two position-sensitive proportional counters (PSPC's) for use in the single exposure mode (SET), and incorporates precise angular qontrol of the incident X-ray beam and data analysis to eliminate irregular Bragg peaks owing to coarse grain structure, An experimental instrument was built tc test the concept (1).

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1985

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References

1. Jones, M. and Cohen, J.B., “Pars - A. Fortable X-ray Analyzer for Residual Stress”, Journal of Testing and Evaluation, Vol. 6 (178), pp. 91-97, (see also U. S. Patent 4095103).Google Scholar
2. Ruud, C.O., “X-ray Analysis and Advances in Field Instrumentation”, Journal of Metals, Vol. 13, No. 6 (1979), pp. 10-15.Google Scholar
3. Castex, L., Spraud, J.M. and Banal, M., “A new, In-Situ Automatic, Strain Measuring X-ray Diffraction Appartus with PSD”, Advances in X-ray Analysis, Vol. 27 (1984), pp. 267-272.Google Scholar
4. Mitchell, C.M., “The CANMET Fortable Stress Diffractometer”, Proc. International Conference on Pipeline Inspection, Edmonton, Alberta (1983), Government of Canada Publishing Centre, Ottawa, Canada, (see also U. S. patent 4561062).Google Scholar
5. Norton, J.T., “X-ray Stress Measurement by the Single Exposure Technique”, Advances in X-ray Analysis, Vol. 11 (1968), pp. 401-410.Google Scholar
6. Mitchell, C.M., “A Dual Detector Diffractometer for Measurement of Residual Stress”, Advances in X-ray Analysis, Vol. 20 (1977), pp, 379-391.Google Scholar
7. Maeder, G., Lebrun, J.L. and praud, J.M., “Present Possibilities for the X-ray Diffraction Method of stress Measurement”, NDT International, October (1981), pp. 235-247.Google Scholar
8. Macherauch, E. and Wolfsteig, U., “A Modified Diffractometer for Stress Measurements”, Advances in X-ray Analysis, Vol. 20 (1977), pp. 369-377.Google Scholar
9. Winegar, J.E., “X-ray Measurement of Residual Stress in Metals at Chalk River Nuclear Laboratories”, Atomic Energy of Canada Ltd. Report #AECL. 961, June (1980).Google Scholar