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Composition and Lattice Constant Evaluation of the Garnet System (Dy, Gd)3Ga5O12

Published online by Cambridge University Press:  06 March 2019

L. A. Moudy  and
S. B. Austerman
L. A. Moudy
Affiliation:
North American Rockwell Electronics Group, Anaheim, California 92803
S. B. Austerman
Affiliation:
North American Rockwell Electronics Group, Anaheim, California 92803
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Abstract

Compositional and lattice constant control of non-magnetic garnet substrates are required for suitable lattice matching with epitaxially deposited magnetic thin film. Suitable substrates for this purpose are the simple and mixed rare earth garnets. Lattice constants were obtained on Czochralski grown crystals by conventional x-ray diffraction powder techniques with a precision of ± .0005Å. An x-ray fluorescence method was developed to determine crystal composition with a precision of ± 0.5 percent. The precision with which a can be determined indirectly by x-ray fluorescence is ± 0.0082Å, which is comparable with that from direct measurement.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 16: 'Twenty-First Annual Conference on Applications of X-ray Analysis, August 2-4, 1972 , 1972 , pp. 177 - 185
Copyright
Copyright © International Centre for Diffraction Data 1972

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References

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