Hostname: page-component-55f67697df-gmt7q Total loading time: 0 Render date: 2025-05-09T06:04:59.996Z Has data issue: false hasContentIssue false
  • English
  • Français

A Comparison of the Performance of Gratings and Crystals in the 20-115 Å Region*

Published online by Cambridge University Press:  06 March 2019

James B. Nicholson  and
David B. Wittry
James B. Nicholson
Affiliation:
Applied Research Laboratories, Inc. Hasler Research Center Goleta, California
David B. Wittry
Affiliation:
University of Southern California Los Angeles, California
Get access

Abstract

Two aluminized gratings with different blaze angles, 1° and 7.55′, and a barium stearate monolayer crystal were compared for first-order X-ray line spectra from oxygen (23.707 Å) to beryllium (113 Å). The peak intensities for the gratings were found to be greater than for the monolayer crystal when the same detector, source, and excitation conditions were used. Line-to-background ratios and halfwidths were comparable.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 7: Twelfth Annual Conference on Applications of X-ray Analysis, August 7-9, 1963 , 1963 , pp. 497 - 511
Copyright
Copyright © International Centre for Diffraction Data 1963

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

Footnotes

*

This work was done in the Development Division of Applied Research Laboratories, Inc., Glendale, California.

References

1. Folsom, T. R. and Cramer, R. A., Technical Report of Scripps Institute of Oceanography, September, 10, 1958.Google Scholar
2. Dolby, R. M., “An X-Ray Microanalyzer for Elements of Low Atomic Number,” X-Ray Optics and X-Ray Microanalysis, Academic Press (in press).Google Scholar
3. Piore, E. D., Harvey, G. G., Gyurgy, E. M., and Kingston, R. H., “High-Vacuum Recording Spectrograph for the Study of Radiation from Solids in the 100-800 A Range,” Rev. Sci. Instr 23: 8, 1952.Google Scholar
4. Fisher, F., Crisp, R. S., and Williams, S. F., Opika Acta 5: 31, 1958.Google Scholar
5. Rogers, J. L. and Chalklin, F. C., “A Geiger Counter Vacuum Spectrometer and Its Use for the Study of Soft X-Ray Lines,” Proc. Phys. Soc, (London) £67: 348, 1954.Google Scholar
6. Holliday, J. E., “Soft X-Ray Spectrometer Using a Flow Proportional Counter,” Rev. Sci. Instr. 31: 891, 1960.Google Scholar
7. Holliday, J. E., “Soft X-Ray Emission Spectroscopy in the 13 to 44 A Region,” J. Appl, Phys, 33: 3259, 1962.Google Scholar
8. DuMond, J. W. M. and Youtz, J. P., “An X-Ray Method of Determining Rates of Diffusion in the Solid State,” J. Appl. Phys. 11: 357, 1940.Google Scholar
9. Blodgett, K. B., “ Films Built by Depo siting Successive Unimolecular Layers on a Solid Surface,” J. Am. Chem. Soc. 57: 1007, 1935.Google Scholar
10. Luther Andrews, C., “Concave Spherical Crystals of Barium Copper Stearate for Use in Long-Wavelength X-Ray Spectrometers,” Rev. Sci. Instr. 11: 111, 1940.Google Scholar
11. Lemasson, A., “Focalisation of Rayons X par des Couches Stratifiées de Stearate de Baryum Courbées Suivant des Cylindres,” Acta Cryst* 6: 97, 1953.Google Scholar
12. Furnas, T. C. Jr. and White, E. W., WADD-TR 61-168.Google Scholar
13. Ditsman, S. A., Izvest. Akad. Nauk SSSR 24 (4): 376, 1960.Google Scholar
14. Sprague, G., Tomboulian, D. H., and Bedo, D. E., “Calculations of Grating Efficiency in the Soft X-Ray Region,“J. Opt. Soc. Am. 45: 756, 1955.Google Scholar
15. James, R. W., The Optical Principles of the Diffraction of X-Rays, Bell and Sons, Ltd., London, 1958, p. 60.Google Scholar
16. Ibid., p. 65.Google Scholar
17. DuMond, J. W. M., Lind, D. A., and Cohen, E. R., “A Precision Method of Generating Circular Cylindrical Surfaces of Large Radius of Curvature for Use in the Curved-Crystal Spectrometer, “ Rev. Sci. Instr. 18: 617, 1947.Google Scholar