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Comparison of the Hanawalt and Johnson-VAND Computer Search/Match Strategies

Published online by Cambridge University Press:  06 March 2019

Satyam C. Cherukuri ,
Robert L. Snyder  and
Donald W. Beard
Satyam C. Cherukuri
Affiliation:
N.Y.S. College of Ceramics, Alfred University, Alfred, N.Y. 14802
Robert L. Snyder
Affiliation:
N.Y.S. College of Ceramics, Alfred University, Alfred, N.Y. 14802
Donald W. Beard
Affiliation:
Siemens Corporation, 1 Computer Drive, Cherry Hill, N.J. 08034
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Extract

Over the past fifteen years two basic computer search/match strategies have evolved. The exhaustive search approach of Johnson and Vand (1) uses a sequential file structure whereas Nichols (2) developed a strategy which uses an inverted file, examining only those patterns containing lines of interest. Frevel (3) was the first to attempt to relate the quality of the reference patterns to the search strategy using a very restricted data base. These “first generation” search/match algorithms were forced to use very wide d and I windows due to the poor quality of the unknown and reference patterns.

Snyder (4) wrote the first “second generation” search/match procedure which takes advantage of high quality of data in the JCPDS data base when it is present. Recently, a minicomputer optimized version of the Johnson-Vand strategy has been incorporated into this search system enabling a chance to compare these two strategies under similar conditions.

Type
II. Search/Match Procedures, Powder Diffraction File
Information
Advances in X-Ray Analysis , Volume 26: Thirty-First Annual Conference on Applications of X-ray Analysis, August 1-6, 1982 , 1982 , pp. 99 - 104
Copyright
Copyright © International Centre for Diffraction Data 1982

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References

1. Johnson, G. G., “The Johnson-Vand Search/Match Algorithm,“ Norelco Reporter, 26-3, 15–18 (1979)Google Scholar
2. Nichols, M. C., “A Fortran II program for the Identification of X-ray Powder Diffraction Patterns,” UCRL-70078, Lawrence Livermore Laboratory, Oct. 1966.Google Scholar
3. Frevel, L.K., “Computational Aids for Identifying Crystalline Phases by Powder Diffraction,” Anal. Chem., 37, 471–2 (1965)Google Scholar
4. Snyder, R. L., “A Hanawalt Type Phase Identification Procedure for a Minicomputer,” Adv. X-ray Anal., 24, 83 (1981)Google Scholar
5. The Siemens Powder Diffraction Search Match System, proprietary Information, Siemens Corporation, 1 Computer Drive, Cherry Hill, N.J. 08034.Google Scholar
6. Mallory, C. L. and Snyder, R. L., “The Alfred University X-ray Powder Diffraction Automation System,” N.Y. S. College of Ceramics Technical Paper 144 (1979).Google Scholar
7. Jenkins, R. and Hubbard, C. R., “A Preliminary Report on the Design and Results of the Second Round Robin to Evaluate Search/Match Methods for Quantitative Powder Diffractometry,“ Adv. X-ray Anal. 22:133–2 (1979).Google Scholar