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Comparison of Experimental and Theoretical Intensities for a New X-Ray Tube for Light Element Analysis

Published online by Cambridge University Press:  06 March 2019

John Kikkert  and
Graham Hendry
John Kikkert
Affiliation:
Philips S & I, Almelo, Holland University of Birmingham, England
Graham Hendry
Affiliation:
Philips S & I, Almelo, Holland University of Birmingham, England
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Extract

While x-ray fluorescence spectrometry is a highly sensitive and highly repoducible method of analysing samples, its one weakness is its relatively low sensitivity for light elements. This is mainly due to two problems: firstly the low fluorescent yield of the low atomic number elements, and secondly to the inherent inefficiency of exciting these elements. While it is not possible to improve the fluorescent yield, considerable improvements in light element sensitivity can be achieved by improvements in x-ray tubes.

Type
VI. J. Gilfrich Honorary Session on Trends in XRF Instrumentation
Information
Advances in X-Ray Analysis , Volume 27: Thirty-Second Annual Conference on Applications of X-ray Analysis, August 1-5, 1983 , 1983 , pp. 423 - 426
Copyright
Copyright © International Centre for Diffraction Data 1983

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References

1. Criss, J. W., “Fundamental-Parameter Calculations on a Lab Microcomputer”, Advances in X-ray Analysis, 23, 93–97, (1980).Google Scholar