Hostname: page-component-586b7cd67f-gb8f7 Total loading time: 0 Render date: 2024-11-26T22:24:41.009Z Has data issue: false hasContentIssue false
  • English
  • Français

Comparison of Elemental Sensitivities Induced by Radioisotope and Secondary Target Excitation for Simultaneous Multielement X-Ray Analysis

Published online by Cambridge University Press:  06 March 2019

J. J. LaBrecque
J. J. LaBrecque*
Affiliation:
Atomic and Nuclear Spectroscopy Laboratory Instituto Venezolano de Investigaciones Cientificas-1V1C Apartado 21827, Caracas 1020A, Venezuela
Get access

Summary

The major advantage of secondary-target X-ray fluorescence analysis is the enchancement of sensitivity and detection limit of an element or small group of elements with similiar atomic numbers by selecting a target material which produces X-rays slightly higher than the absorption edges of the analysis of interest. Secondary target excitation systems are, however, being employed for simultaneous determinations of a large range of elements. Thus, it was decided to compare the application of a simple secondary target X-ray fluorescence system with excitation from a Cd-109 annular radioisotope source.

A simple secondary target X-ray fluorescence system was constructed and optimized which operates at less than 800 kilowatts. The “relative” elemental sensitivities of this system. and a radioisotope system with a Cd-109 annular source were compared by the analysis of the 1-2-3-multi-spectral standard from Chemplex which contains 1.23% of 53 elements. The characteristic X-rays were collected with the same Si(Li) detector and analyzed with the same Apple lie microprocessor with a Nucleus ADC/interface card. Finally, the secondary target system described herein with a molybdenum X-ray tube and zirconium or cadmium target produced similiar elemental sensitivities as a Cd-109 annular source of about 7.5 mCi and 5.0 mCi intensity respectively.

Type
XIV. XRS Applications
Information
Advances in X-Ray Analysis , Volume 35 , Issue B: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 1121 - 1126
Copyright
Copyright © International Centre for Diffraction Data 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1) Stehr, K. and Bogert, J., “Source - Tuned XRF spectrometry with light element analysis”, American Laboratory, March, 1988.Google Scholar
2) Pella, P. A. and Soares, C. G., “Secondary Target X-ray Excitation for In Vivo Measurement of Lead in Bone”, presented at the 3 9th Annual Denver Conference on Applications of X-ray Analysis, July 30-August 3, 1990, Steamboard Springs, Colorado, USA.Google Scholar
3) LaBrecque, J. J., “Radiosiotope induced X-ray fluorescence”, Progress in Analytical Atomic Spectroscopy, 4, (1981) 191–217.Google Scholar
4) Borowski, K., Priess, I. L., LaBrecque, J. J. and Pauley, C., “Use of an Apple II plus microcomputer as a multichannel analyzer for X-ray fluorescence spectrometry”, Computer Enhanced Spectroscopy, 1, (1983) 99–105.Google Scholar