Hostname: page-component-78c5997874-v9fdk Total loading time: 0 Render date: 2024-11-16T17:24:40.440Z Has data issue: false hasContentIssue false
  • English
  • Français

Combined XRD and XRF Analysis for Portable and Remote Applications

Published online by Cambridge University Press:  06 March 2019

Jonathan A. Kerner ,
Edward D. Franco  and
John Marshall
Jonathan A. Kerner
Affiliation:
Advanced Research and Applications Corporation 425 Lakeside Dr., SunnyvaleCalifornia 94086
Edward D. Franco
Affiliation:
Advanced Research and Applications Corporation 425 Lakeside Dr., SunnyvaleCalifornia 94086
John Marshall
Affiliation:
SETI Institute, Mountain View, California
Get access

Abstract

A prototype instrument, which provides x-ray powder diffraction and x-ray fluorescence analysis in a compact unit, has been developed to support the needs of NASA for planetary exploration. The instrument uses a 9-watt Fe-anodc x-ray tube and CCD in a fixed geometry for recording powder patterns with a 2θ range of 35°. The fluorescence spectrum for elements below Fe is collected simultaneously with the diffraction data. A shuttered Cd-109 isotopic source with emissions at 22 and 80 keV is used to excite higher energy fluorescence.

The low-energy limit for discriminating single photon events was found to be ∼1.5 keV. Al-K could be distinguished from a pure sample, but the spectrum below 6 keV was degraded by the read noise of the CCD, which introduced spectral artifacts. Diffraction peaks from halite had a FWHM of ∼1°(2θ), with major contributions to the width from the use of slit collimation on the source and the low tilt angle of the sample.

Type
IV. New Developments in X-Ray Sources, Instrumentation and Techniques
Information
Advances in X-Ray Analysis , Volume 38: Forty-third Annual Conference on Applications of X-ray Analysis , 1994 , pp. 319 - 324
Copyright
Copyright © International Centre for Diffraction Data 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Parrish, William, Lunar X-Ray Diffractometer, Final Report (1961), #X64-80875, NASA Scientific and Technical Information Facility.Google Scholar
2. Clark, B.C. Ill, Martin Marietta, personal communication.Google Scholar
3. Luppino, G., Ceglio, N., Doty, J., Ricker, G., and Vallerga, J., “Imaging and Nondispersive Spectroscopy of Soft X Rays Using Laboratory X-ray Charge-Coupled-Device System”, Opt. Eng. 26(10), 1048–1054 (1987).Google Scholar
4. Janesick, J., Elliott, S., McCarthy, J., Marsh, H., Collins, S. and Blouke, M.,“Present and Future CCDs for UV and X-ray Scientific Measurements”, IEEE Transactions NS-32 (1), 409 (1985).Google Scholar
5. Lumb, D. H., Nousek, J. A. “Energy Response of Astronomical CCD X-ray Detectors.” in X-ray Detector Physics and Applications, ed. Orphan, V. J., Proc, SPIE 1736, 1992.Google Scholar