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A Combined Photoelectron/X-Ray Fluorescence Spectrometer

Published online by Cambridge University Press:  06 March 2019

H. K. Herglotz  and
D. R. Lynch
H. K. Herglotz
Affiliation:
Engineering Physics Laboratory, E. I. du Pont de Nemours & Co. (Inc.), Wilmington, Delaware
D. R. Lynch
Affiliation:
Engineering Physics Laboratory, E. I. du Pont de Nemours & Co. (Inc.), Wilmington, Delaware
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Abstract

Facilities for energy-dispersive x-ray fluorescence analysis have been added to an advanced version of the high-sensitivity ESCA (electron spectroscopy for chemical analysis) instrument described at the 1972 Denver Conference. Since the excitation mechanisms for electron emission and x-ray fluorescence are the same, the instrument's powerful source of primary x-rays is an asset to both types of spectroscopy. The geometrical arrangement of source, electron analyzer, and x-ray detector permits easy change from one mode of operation to the other without change of sample. While ESCA is valuable for the analysis of light elements and of surfaces apart from the bulk, x-ray fluorescence is useful for the analysis of bulk or substrate. The high excitation power makes the instrument useful also for trace analysis in solid or liquid samples. Modifications that could further enhance the usefulness of the instrument are described.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 17: Twenty-Second Annual Conference on Applications of X-ray Analysis, August 22-24, 1973 , 1973 , pp. 509 - 520
Copyright
Copyright © International Centre for Diffraction Data 1973

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References

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