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Combined Asymmetric Reflection and Transmission Method for High Accuracy X-Ray Crystallographic Measurements

Published online by Cambridge University Press:  06 March 2019

Danut Dragoi
Danut Dragoi*
Affiliation:
University of DenverDepartment of Engineering Denver, CO 80208
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Abstract

The work describes a method for determining the orientation of crystallographic planes in thin samples using both asymmetric Bragg reflection and asymmetric Laue transmission method.

The method is based on the extension of a system of nonlinear equations for the reflection case. The solutions of the system of nonlinear equations in question can be positive, negative or mixed with physical significance. The positive solutions correspond to reflection case, while the negative solutions are for transmission case. The mixed solutions were generated for the planes {111} in a cubic structure.

A theoretical test is given for a silicon sample. The results are in good agreement with the experimental results given in literature.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 37: Forty-Second Annual Conference on Applications of X-ray Analysis, August 2-6, 1993 , 1993 , pp. 153 - 156
Copyright
Copyright © International Centre for Diffraction Data 1993

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References

Dragoi, D. (1992a), J. Appl. Cry St., 25, 6–10.Google Scholar
Dragoi, D. (1992b), “Advances in X-Ray Analysis”, vol. 35, pg. 681, Plenum Press.Google Scholar
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