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Chemical State Analyses of Sulfur, Chromium and Tin by High Resolution X-Ray Spectrometry

Published online by Cambridge University Press:  06 March 2019

Y. Gohshi ,
O. Hirao  and
I. Suzuki
Y. Gohshi
Affiliation:
Toshiba Research and Development Center Komukai-Toshiba, Saiwai, Kawasaki, 210, Japan
O. Hirao
Affiliation:
Toshiba Research and Development Center Komukai-Toshiba, Saiwai, Kawasaki, 210, Japan
I. Suzuki
Affiliation:
Toshiba Research and Development Center Komukai-Toshiba, Saiwai, Kawasaki, 210, Japan
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Abstract

Chemical shifts of SKα, CrKβ1,3 and SnLβ2 were precisely measured with a two-crystal X-ray spectrometer (Toshiba AFV 701). Sulfur in the coke for iron smelting takes two oxidation states, i.e., S2− and S6+. Quantitative analyses of S2− and S6+ were performed by precisely measuring the profile of SKα and fitting the standard S2− of S6+ curve to the observed SKα profile with the non-linear least square method. Chemical shifts of CrKβ1,3 and SnLβ2 were utilized for the determinations of Cr6+, Cr3+, Sn4+ and Sn2+ in electro-plating solutions. Intensity ratio of IA to Ig was measured, where B means the point which showed an intensity independent of oxidation states. A means the point which showed the most dependent. Linear relations were found between intensity ratio IA/IB and Cr3+/Cr or Sn2+/Sn.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 18: Twenty-Third Annual Conference on Applications of X-ray Analysis, August 7-9, 1974 , 1974 , pp. 406 - 414
Copyright
Copyright © International Centre for Diffraction Data 1974

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References

1. Lindth, A. E. and Lundquits, O., “Die Structure der Kβ1-Line des Schwefels,” Ark. Hat. Astr. Fysi. 18, 3–11 (1924)Google Scholar
2. Gohshi, Y., Hukao, Y. and Hori, K., “A Wide-range, Single-axis, Vacuum Two-crystal Spectrometer for Fluorescent X-ray Analysis,” Spectrochim. Acta, 27B, 135–142 (1972).Google Scholar
3. Connolly, J. W. D. and Haughton, D. R., “The Valence of Sulfur in Glass of Basaltic Composition Formed under Conditions of Low Oxidation Potential,” Amer. Mineral. 57, 1515–1517 (1972)Google Scholar
4. Gohshi, Y. and Yanagase, K., “Chemical State Analysis of Sulfur in Coal by High Resolution Fluorescent X-ray Spectrometry,” J. Fuel Soc. Japan, 52, 926–931 (1973)Google Scholar
5. Gohshi, Y. and Ohtsuka, A., “The Application of Chemical Effects in High Resolution X-ray Spectrometry,” Spectrochim. Acta, 28B, 179–188 (1973)Google Scholar