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Calculation and Measurement of Integral Reflection Coefficient Versus Wavelength of “Real” Crystals on an Absolute Basis

Published online by Cambridge University Press:  06 March 2019

D. B. Brown ,
M. Fatemi  and
L. S. Birks
D. B. Brown
Affiliation:
Naval Research Laboratory, Washington, D. C. 20375
M. Fatemi
Affiliation:
Naval Research Laboratory, Washington, D. C. 20375
L. S. Birks
Affiliation:
Naval Research Laboratory, Washington, D. C. 20375
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Abstract

A method for calculation of the integral reflection coefficient of crystals of interrnediate perfection is introduced. This method can greatly reduce experimental effort for the selection and calibration of crystals, It also serves as a conceptual framework for studies of mosaic block structure and of crystal modification. Good agreement between calculated and experimental values of the integral reflection coefficient is shown for, (a) LiF crystals of two degrees of perfection, (b) elastically bent quartz, and (c) 001, 005, 006, and 007 diffraction from KAP. Zachariasen's division of crystals into two types is extended. It is concluded that the integral reflection coefficients for 200 LiF cannot be raised to the ideally imperfect limiting values.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 17: Twenty-Second Annual Conference on Applications of X-ray Analysis, August 22-24, 1973 , 1973 , pp. 436 - 444
Copyright
Copyright © International Centre for Diffraction Data 1973

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References

1. Zachariasen, W. H., “A General Theory of X-Ray Diffraction in Crystals,” Acta Cryst. 23, 558–564 (1967).Google Scholar
2. Birks, L. S. and Seal, R. T., “X-Ray Properties of Deformed LiF,” Phys J. Appl., 28, 541–543 (1957).Google Scholar
3. Vierling, J., Gilfrich, J. V., and Birks, L. S., “Improving the Diffracting Properties of LiF,” Appl. Spectry. 23, 342–345 (1969).Google Scholar
4. White, J. E., “X-Ray Diffraction by Elastically Deformed Crystals,” J. Appl. Phys, 21, 855–859 (1950).Google Scholar
5. Burkhalter, P. G., Whitlock, R. R., Gilfrich, J. V., and Birks, L. S., Naval Research Laboratory, unpublished data,Google Scholar
6. Birks, L. S., “Electron Probe Microanalysis,” p. 75 ff., John Wiley (1963); or p . 43 ff., John Wiley (1971).Google Scholar