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The Application of X-Ray Fluorescence and Diffraction to the Characterization of Environmental Assessment Samples

Published online by Cambridge University Press:  06 March 2019

Albert C. Censullo
Affiliation:
U.S. Environmental Protection Agency Industrial Environmental Research Laboratory Technical Support Staff Research Triangle Park, NC 27711
Frank E. Briden
Affiliation:
U.S. Environmental Protection Agency Industrial Environmental Research Laboratory Technical Support Staff Research Triangle Park, NC 27711
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Extract

The Technical Support Staff is called upon for analysis of a wide variety of sample types many of which have little sample history. However, it is usually necessary to account for all elements present. For these reasons, x-ray fluorescence spectrometry (XRF) has been a useful tool. Unfortunately, XRF requires the use of a range of standards for each element, the preparation of which could become so time consuming that the advantages of XRF would soon be diluted. Consequently, the utility of the J. W. Criss fundamental parameters computer program was evaluated for samples in which only one standard per element was used and where the standard matrix did not strictly resemble the unknown matrix. Some of the results of these tests on environmental assessment samples are reported here.

Type
V. XRF Environmental Applications
Copyright
Copyright © International Centre for Diffraction Data 1981

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References

1. Criss, J. W., Fundamental Parameters Calculations on a Laboratory Microcomputer, Advances in X-ray Analysis, 23:93, Plenum Publishing Corp., 1980.Google Scholar
2. Johnson, G. G., Jr., “User Guide”, Publ. by JCPDS, 1975.Google Scholar
3. Gladney, E. S., Analytica Chimica Acta, 118:385 (1980).Google Scholar