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Application of the Fundamental Parameter Method to Analyses of Light Element Compounds Considering the Scattering Effects

Published online by Cambridge University Press:  06 March 2019

Shigeyuki Mori  and
Michael Mantler
Shigeyuki Mori
Affiliation:
Research and Development Center, Sumitomo Metal Industries, Ltd., Fusocho, Amagasaki, Japan
Michael Mantler
Affiliation:
Institute for Applied and Technical Physics, Technical University Vienna, A1040 Vienna, Austria
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Extract

The fundamental parameter (FP) method has been applied to many elemental analysis fields because of the advantage that it does not require standards of the same matrix as the unknown. In most FP software packages only primary and secondary excitations are included in the mathematical models, and hardly any software for routine applications has ever been reported involving the secondary enhancement by scattered radiation (SESR) as well as the scattered primary fluorescent radiation (SPFR). This can lead to errors in the analyses of compounds rich in light elements, like oxides, nitrides, carbides, borides, etc.

Type
II. Analysis of Light Elements by X-Ray Spectrometry
Information
Advances in X-Ray Analysis , Volume 36: Forty-First Annual Conference on Applications of X-ray Analysis, August 3-7, 1992 , 1992 , pp. 47 - 57
Copyright
Copyright © International Centre for Diffraction Data 1992

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References

1. Laguitton, D. and Mantler, M., LAMA I - A General Fortran Program for Quantitative X-Ray Fluorescence Analysis, Adv. in X-Ray Anal. 20: 515 (1977)Google Scholar
2. Criss, J. W., NRLXRF, A Fortran Program for X-Ray Fluorescence Analysis, Program No. DOD00065, Computer Management and Information Center (1977)Google Scholar
3. Mori, S. and Matsumoto, Y., Iron and Steel International 30: 786 (1990)Google Scholar
4. Mori, S. and Matsumoto, Y., Iron and Steel International 32: 1348 (1992)Google Scholar
5. Arai, T., Shoji, T. and Omote, K., Adv. in X-Ray Anal. 29:413 (1986)Google Scholar
6. McMaster, W. H., del Grande, N. K., Mallet, J. H. and Hubbell, J. H., “Lawrence Laboratory Rept. UCRL-50174”, NIST, (1969)Google Scholar
7. Bearden, J. A. and Thomson, J. S., “X-Ray Wavelength and Atomic Energy Levels”, American Institute of Physics Handbook, McGraw Hill, New York (1972)Google Scholar
8. Fink, R. W. (J.W. Johnson, ed.), “Handbook of Spectroscopy I”, CRC press, (1974)Google Scholar
9. Salem, S. I., Panossian, S. L. and Krause, R. A., Atomic Data and Nucl. Data Tables, (1974)Google Scholar
10. Cromer, D. T. and Waber, J. T., Acta Cryst., 18:104 (1965)Google Scholar
11. Saloman, E. B., Hubbell, J. H. and Scofield, J. H., Atomic Data and Nucl. Data Tables, 38:1 (1988)Google Scholar
12. Tertian, R. and Claisse, F., “Principles of Quantitative X-Ray Fluorescence Analysis”, Heyden, London (1982)Google Scholar