No CrossRef data available.
Article contents
The Application of Radioisotope Nondispersive X-Ray Spectrometry to the Analysis of Molybdenum
Published online by Cambridge University Press: 06 March 2019
Abstract
Radioisotope excitation, solid-state detection, and multichannel pulse-height analysis have been applied successfully to the determination of molybdenum in copper and molybdenum-process intermediates. Analytical data are presented, and comparisons are made with the conventional X-ray fluorescence approach. The equipment performed satisfactorily in molybdenum plant control and shows promise for other industrial applications with the development of suitable isotope sources.
- Type
- Research Article
- Information
- Copyright
- Copyright © International Centre for Diffraction Data 1967
References
1.
Campbell, W. J., Brown, T. D., and Thatcher, J. W., “X-Ray Absorption and Emission, “A nal, Chem.
38: 418R-420R, April, 1966.Google Scholar
2.
Karttunen, J. O. and Henderson, D. J., “An Improved Portable Fluorescent X-Ray Instrument Using Radioisotope Excitation Sources,” Anal. Chem.
37; 307-309, Feb., 1965.Google Scholar
3.
Darnley, A. G. and Gallagher, M. J., ‘'Progress Report on Use of Portable Radioisotope X-Ray Fluorescence Analyser,” Trans. Inst. Mining Met.
711: B1O5-106, Feb., 1966.Google Scholar
4.
Rhodes, J. R., “Radioisotope X-Ray Spectrometry, A Review,” Analyst
91: 683–699, Nov., 1966.Google Scholar
5.“X-Ray Unit Uses Solid-State Detector,” Chemical and Engineering News 42: USA, Jan. 3, 1966.Google Scholar
6.
Bowman, H. R., Hyde, E. K., Thompson, S. G., and Jared, R. C., “Application of High-Resolution Semiconductor Detectors in X-Ray Emission Spectrograph;',” Science
151: 562–568, Feb. 4, 1966.Google Scholar
7.
Muller, R. H., “Characteristic X-Rays Excited by Radioisotopes,” Anal. Chem.
38: All5-117, Oct., 1966.Google Scholar
8.
Rhodes, J. R., “Radioisotope X-Ray Spectrometry, A Review,” Analyst
91: 684–686, 690. Nov, 1966.Google Scholar
9.
Andermann, G., “Semitheoretical Approach to Interelement Correction Factors in Secondary X-Ray Emission Analysis,” Anal. Chem.
38: 82–86, Jan., 1966.Google Scholar
10.
Alley, B. J. and Myers, R. H., “Corrections for Matrix Effects in X-Ray Fluorescence Analysis, Using Multiple Regression Methods,” Anal. Chem.
37: 1685–1690, Dec. 1965.Google Scholar
11.
French, R. O., Vaughn, R. W., Langheinrich, A. P., and Baum, J. F., “Application of Continuous XRF Analysis to Mill Control,” paper presented at the Symposium on Continuous Process Control, AIME, Philadelphia, Pa., Dec. 5, 1966.Google Scholar
12.
Liebhafsky, H. A., Pfeiffer, H. G., Winslow, S. H., and Zemany, P. D., X-Ray Absorption and Emission in Analytical Chemistry,
John Wiley and Sons, Inc., New York, 1960, pp. 162–191.Google Scholar