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The Application of High-Resolution Solid State Detectors to X-Ray Spectrometry - A Review

Published online by Cambridge University Press:  06 March 2019

R. L. Heath
R. L. Heath*
Affiliation:
Aerojet Nuclear Company, National Reactor Testing Station Idaho Falls, Idaho
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Abstract

Developments during the past few years in solid-state radiation detectors and low-noise electronics employing field-effect transistors operated at cryogenic temperatures have resulted in the availability of high-resolution energy-dispersive spectrometers for a variety of applications in x-ray spectrometry. Using pulseamplitude analysis techniques, these spectrometers make it possible to obtain multi-elemental analyses on a routine laboratory basis employing x-ray fluorescence techniques. The combination of these spectrometers with small, inexpensive on-line computer data systems makes It possible to obtain rapid on-line qualitative and quantitative analysis of samples in the laboratory and in special field applications. A general review of the present state of development in detectors, electronics and on-line data systems will be presented together with descriptions of applications of such equipment in the laboratory.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 15: Twentieth Annual Conference on Applications of X-ray Analysis, August 11-13, 1971 , 1971 , pp. 1 - 35
Copyright
Copyright © International Centre for Diffraction Data 1971

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