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The Application of a Soft X-Ray Spectrometer to Study the Oxygen and Fluorine Emission Lines from Oxides and Fluorides

Published online by Cambridge University Press:  06 March 2019

R. A. Mattson  and
R. C. Ehlert
R. A. Mattson
Affiliation:
General Electric Company, Milwaukee, Wisconsin
R. C. Ehlert
Affiliation:
General Electric Company, Milwaukee, Wisconsin
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Abstract

Results are shown for O and F K emission lines from several oxide and fluoride compounds. The spectra are examined for both structure and wavelength. Excitation of the spectra is by both electrons and X-rays. The emission spectra from several oxygen- and fluorine-bearing gases and the influence of the composition of the diffracting crystal on the shape of the observed oxygen spectra are also discussed. Curved crystals of potassium acid phthalate and lead stearate, and a thin-window flow proportional counter, are used to obtain the results.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 9: Fourteenth Annual Conference on Applications of X-ray Analysis, August 25-27, 1965 , 1965 , pp. 471 - 486
Copyright
Copyright © International Centre for Diffraction Data 1965

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References

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