Hostname: page-component-78c5997874-fbnjt Total loading time: 0 Render date: 2024-11-16T16:10:58.110Z Has data issue: false hasContentIssue false
  • English
  • Français

Application of a New Solid State X-Ray Camera to Stress Measurement

Published online by Cambridge University Press:  06 March 2019

M.A. Korhonen ,
V.K. Lindroos  and
L.S. Suominen
M.A. Korhonen
Affiliation:
Helsinki University of Technology, Laboratory of Materials Science, 02150 Espoo, Finland
V.K. Lindroos
Affiliation:
Helsinki University of Technology, Laboratory of Materials Science, 02150 Espoo, Finland
L.S. Suominen
Affiliation:
Mexpert Instrument Technology Ltd., Otanieini Science Park, 02150 Espoo, Finland
Get access

Extract

X-ray camera methods of stress measurement are inherently flexible and easy to apply in different situations because of the low weight, portability and maneuverability of the equipment. However, the digital intensity recording with the resulting objectivity and better statistical accuracy has given the diffractometer methods a distinct advantage over the conventional camera methods.

Type
VII. X-Ray Stress Analysis
Information
Advances in X-Ray Analysis , Volume 32: Thirty-Seventh Annual Conference on Applications of X-ray Analysis, August 1-5, 1988 , 1988 , pp. 407 - 413
Copyright
Copyright © International Centre for Diffraction Data 1988

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Cullity, B.D., Elements of X-ray Diffraction, 2nd ed. , Addison-Wesley, 1978 Google Scholar
2. Simomaa, K., Kelha, V., Tuomi, T., Korhonen, M.A., and Suominen, L., Proc. Conf. Image Detection and Quality, July 16-18, 1986, Paris, 203Google Scholar
3. Koppel, L.N., Adv. X-Ray Anal. 19: 587 (1976)Google Scholar
4. Laumspach, J., Bourgade, J.L., Cavailler, C., de Mascureau, J., Mens, A. and R. Saunef, SPIE 689:244 (1986)Google Scholar
5. Cullity, B.D., Elements of X-ray Diffraction, Addison-Wesley, first ed. 1956Google Scholar
6. Korhonen, M.A. and Lindroos, V.K., Scand. J. Metallurgy 2:101 (1973)Google Scholar
7. Macherauch, E. and Wolfstieg, U., Adv. X-Ray Anal. 20: 369 (1977)Google Scholar
8. Korhonen, M.A., D. Sc. Thesis, Helsinki Univ. of Technology, 1980Google Scholar
9. Tönschoff, K., Brinkstneier, E., and Nölke, H.H., Z. Metallkde 72:349 (1981)Google Scholar