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Anomalies in Measurement of Residual Stress by X-Ray Diffraction

Published online by Cambridge University Press:  06 March 2019

R. H. Marion  and
J. B. Cohen
R. H. Marion
Affiliation:
Northwestern University Evanston, Illinois 60201
J. B. Cohen
Affiliation:
Northwestern University Evanston, Illinois 60201
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Abstract

Residual stresses are expected to lead to a linear dependence of the interplanar spacing, d, on sin2ψ (where ψ is the sample tilt) and the stress can be obtained from the slope of this line, As a result of the linear dependence a two-tilt method is often employed to obtain the stress. However, when a specimen is subjected to extensive plastic deformation large deviations from a straight line can occur and a two-point method can lead to an erroneous stress determination. The results reported here show that: (1) this is more likely to occur in homogeneous materials than in multiphase materials (2) the oscillations follow closely the variation in peak intensity due to texture (3) the oscillations are caused by microstresses which are due to an "orientation" effect as suggested by Weidemann,

A simple, easy-to-use procedure has been developed and tested to correct the data and obtain the correct macrostress.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 18: Twenty-Third Annual Conference on Applications of X-ray Analysis, August 7-9, 1974 , 1974 , pp. 466 - 501
Copyright
Copyright © International Centre for Diffraction Data 1974

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