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Published online by Cambridge University Press: 06 March 2019
The potential of energy-dispersive X-ray fluorescence spectrometry for analysis of refractory metals and WC-based hard metals is investigated. Both, photon excitation by filtered tube radiation and by the characteristic, lines of a secondary target are employed. Both excitation systems give good results. If the counting times are adjusted to account for the lower sensitivity of energy dispersive as opposed to wavelength dispersive X-ray spectrometry the detection limit and precision data are comparable. The multielement analyses of interest in these applications that comprise an energy range of 5 keV or more are better handled by direct excitation with filtered tube radiations than either by secondary target excitation or by wavelength dispersive X-ray spectrometry.